Tianxu Zhao

	2003
3		Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17
	2001
2		Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-
	2000
1		Tianxu Zhao, Yue Hao, Yong-Chang Jiao: VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. DFT 2000: 41-46

Coauthor Index

1	Taifeng Chen	[2]
2	Xuchao Duan	[3]
3	Yue Hao	[1] [2] [3]
4	Yong-Chang Jiao	[1]
5	Peijun Ma	[2] [3]