Victor Zieren

	1999
2		Bram Kruseman, Peter Janssen, Victor Zieren: Transient current testing of 0.25 /spl mu/m CMOS devices. ITC 1999: 47-56
	1998
1		Manoj Sachdev, Peter Janssen, Victor Zieren: Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. ITC 1998: 204

Coauthor Index

1	Peter Janssen	[1] [2]
2	Bram Kruseman	[2]
3	Manoj Sachdev	[1]