IEEE Design & Test of Computers, Volume 25

Volume 25, Number 1, January/February 2008

• Tim Cheng:
  From the EIC. 4
  Electronic Edition (link) BibTeX
• Bruce C. Kim, Craig Force:
  Guest Editors' Introduction: The Evolution of RFIC Design and Test. 6-8
  Electronic Edition (link) BibTeX
• Vasanth Kakani, Fa Foster Dai:
  Design and Analysis of a Transversal Filter RFIC in SiGe Technology. 10-16
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• Changwook Yoon, Junwoo Lee, Young-Jin Park, Hyunjeong Park, Jaemin Kim, Junso Pak, Joungho Kim:
  Design of a Low-Noise UWB Transceiver SiP. 18-28
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• Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
  Decreasing Test Qualification Time in AMS and RF Systems. 29-37
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• Joe Kelly, Dean Nicholson, Edwin Lowery, Victor Grothen:
  Light-Enhanced FET Switch Improves ATE RF Power Settling. 38-43
  Electronic Edition (link) BibTeX
• John Mark Nolen, Rabi N. Mahapatra:
  Time-Division-Multiplexed Test Delivery for NoC Systems. 44-51
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• Jorgen Peddersen, Sri Parameswaran:
  Low-Impact Processor for Dynamic Runtime Power Management. 52-62
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• Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos:
  Hybrid-SBST Methodology for Efficient Testing of Processor Cores. 64-75
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• Daniele Rossi, André K. Nieuwland, Cecilia Metra:
  Simultaneous Switching Noise: The Relation between Bus Layout and Coding. 76-86
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• Scott Davidson:
  How to make your own processor architecture. 96-98
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• Joe Damore:
  DATC Newsletter. 102
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• Bruce C. Kim:
  TTTC Newsletter. 103
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• William Krenik:
  Changing times in the RF world. 104
  Electronic Edition (link) BibTeX

Volume 25, Number 2, March/April 2008

• Tim Cheng:
  Test compression saves bits, cycles, and money. 105
  Electronic Edition (link) BibTeX
• Scott Davidson, Nur A. Touba:
  Guest Editors' Introduction: Progress in Test Compression. 112-113
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• Rohit Kapur, Subhasish Mitra, Thomas W. Williams:
  Historical Perspective on Scan Compression. 114-120
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• Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu:
  VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. 122-130
  Electronic Edition (link) BibTeX
• Chao-Wen Tzeng, Shi-Yu Huang:
  UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. 132-140
  Electronic Edition (link) BibTeX
• Kee Sup Kim, Ming Zhang:
  Hierarchical Test Compression for SoC Designs. 142-148
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• Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
  Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. 150-159
  Electronic Edition (link) BibTeX
• Qizhang Yin, William R. Eisenstadt, Tian Xia:
  Wireless System for Microwave Test Signal Generation. 160-166
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• Melvin A. Breuer, Haiyang (Henry) Zhu:
  An Illustrated Methodology for Analysis of Error Tolerance. 168-177
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• Hamidreza Hashempour, Fabrizio Lombardi:
  Device Model for Ballistic CNFETs Using the First Conducting Band. 178-186
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• Joe Damore:
  DATC Newsletter. 187
  Electronic Edition (link) BibTeX
• Victor Berman:
  Standards update from IP 07. 192-193
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• Sachin S. Sapatnekar:
  Building your yield of dreams. 194-195
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• Bruce C. Kim:
  TTTC Newsletter. 198-199
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• Scott Davidson:
  The commonality of vector generation techniques. 200
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