IEEE Design & Test of Computers, Volume 8
Volume 8, Number 1, January-March 1991
News. 2-5
- Wayne Wolf: Object Programming for CAD. 35-42
- Mehrdad Bidjan-Irani: A Rule-Based Design-for-Testability Rule Checker. 50-57
- Joachim Roos: Designing a Real-Time Coprocessor for Ada Tasking. 67-79
- A D&T Roundtable: ASIC Alternatives for System Design. 80-90
- TTTC Newsletter. 91-93
- Book Review. 92-93
- Conference Reports. 94-95
- Product Review. 96-97
- DATC Newsletter. 102-103
Volume 8, Number 2, April-June 1991
- News. 2-3, 103
- Stephen Walters: Computer-Aided Prototyping for ASIC-Based Systems. 4-10
- Richard I. Hartley, Kenneth Welles II, Michael Hartman, Abhijit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty: A Rapid-Prototyping Environment for Digital-Signal Processors. 11-25
- Jan M. Rabaey, C. Chu, Phu D. Hoang, Miodrag Potkonjak: Fast Prototyping of Datapath-Intensive Architectures. 40-51
- Marc Engels, Rudy Lauwereins, J. A. Peperstraete: Rapid Prototyping for DSP Systems with Multiprocessors. 52-62
- Dilip K. Bhavsar: Testing Interconnections to Static RAMs. 63-71
- Elisabeth Auth, Michael H. Schulz: A Test-Pattern-Generation Algorithm for Sequential Circuits. 72-86
- A D&T Roundtable- Six Sigma: Moving Towards Perfect Products. 88-99
- Book Review. 100-102
- DATC Newsletter. 108-109
- TTTC Newsletter. 110-111
Volume 8, Number 3, July-September 1991
- News. 2-4, 9
- Andrew J. Graham: The DAD Reamework Interactive. 12-15
- Paul S. Levy: Designing in Power-Down Test Circuits. 31-35
- G. Antonin, H.-D. Oberle, Jochen Kolzer: Electrical Characterization of Megabit DRAMs, Part 1: External Testing. 36-43
- Bjorn Dahlberg: Increasing Test Accuracy by Varying Driver Slew Rate. 44-48
- Rajiv Gupta, Rajagopalan Srinivasan, Melvin A. Breuer: Reorganizing Circuits to Aid Testability. 49-57
- Prawat Nagvajara, Mark G. Karpovsky, Lev B. Levitin: Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test. 58-65
- A D&T Roundtable: Design for Manufacturability. 66-76
- Conference Reports. 78-84
- Product Review. 86-
- Book Review. 90-91
- TTTC Newsletter. 92-93
- DATC Newsletter. 94-95
Volume 8, Number 4, October-December 1991
- Editor-in-Chief's Message. 2-3
- Disaster Recovery Centers. 4-5
- Karlheinz Hafner, Hartmut C. Ritter, Thomas M. Schwair, Stefan Wallstab, Michael Deppermann, Jürgen Gessner, Stefan Koesters, Wolf-Dietrich Moeller, Gerd Sandweg: Design and Test of an Integrated Cryptochip. 6-17
- David A. Fechser: A Methodology for Debugging ASIC Prototypes in the Field. 18-23
- Jochen Kolzer, Johann Otto: Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing. 39-51
- Richard Absher: Test Engineering Education is Rational, Feasible, and Relevant. 52-62
- I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick: Economic Effects in Design and Test. 64-77
- 1991 Annual Index. 78-81
- Book Review. 82-84
- Conference Reports. 84-86
- Direct Access Network. 87-
- TTTC Newsletter. 92-93
- DATC Newsletter. 94-95
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