Volume 111, January 2005
Proceedings of the Workshop on Model Based Testing (MBT 2004)
- Yuri Gurevich, Alexander K. Petrenko, Alexander Kossatchev:
Preface.
1-3
- Keith Stobie:
Model Based Testing in Practice at Microsoft.
5-12
- Mirko Conrad, Ines Fey, Sadegh Sadeghipour:
Systematic Model-Based Testing of Embedded Automotive Software.
13-26
- Giuseppe Scollo, Silvia Zecchini:
Architectural Unit Testing.
27-52
- Antti Kervinen, Pablo Virolainen:
Heuristics for Faster Error Detection With Automated Black Box Testing.
53-71
- Seung Mo Cho, Jae Wook Lee:
Lightweight Specification-based Testing of Memory Cards: A Case Study.
73-91
- Bruno Marre, Benjamin Blanc:
Test Selection Strategies for Lustre Descriptions in GATeL.
93-111
- Manoranjan Satpathy, Michael Leuschel, Michael J. Butler:
ProTest: An Automatic Test Environment for B Specifications.
113-136
- Victor V. Kuliamin:
Multi-paradigm Models as Source for Automated Test Construction.
137-160
- Hans-Gerhard Groß, Ina Schieferdecker, George Din:
Model-Based Built-In Tests.
161-182
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