Volume 10, Numbers 1-2, February 1997
: Fundamentals of MCM Testing and Design-for-Testability.
: MCM Test Strategy Synthesis from Chip Test and Board Test Approaches.
Najmi T. Jarwala
: Designing "Dual Personality" IEEE 1149.1 Compliant Multi-Chip Modules.
: A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules.
Volume 10, Number 3, June 1997
: Delay Test Generation: A Hardware Perspective.
: Module Level Weighted Random Patterns.