Volume 20, Number 1, February 2004
: Test Technology Technical Council Newsletter.
: Control and Observation Structure for Analog Circuits with Current Test Data.
: Testing and Reliability Techniques for High-Bandwidth Embedded RAMs.
Volume 20, Number 2, April 2004
Volume 20, Number 3, June 2004
: A Note on System-on-Chip Test Scheduling Formulation.
Volume 20, Number 4, August 2004
Special Issue on the Third IEEE Latin-American Test Workshop
Volume 20, Number 5, October 2004
: Design of Embedded Self-Testing Checkers for t-UED and BUED Codes.
Volume 20, Number 6, December 2004
: Modeling Custom Digital Circuits for Test.
: Area Minimization of Exclusive-OR Intensive Circuits in FPGAs.
, Krishnendu Chakrabarty
: On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression.