Journal of Electronic Testing, Volume 23

Volume 23, Number 1, February 2007

• Vishwani D. Agrawal:
  Editorial. 5
  
• Bruce C. Kim:
  Test Technology Newsletter. 9-10
  
• Chunsheng Liu:
  Improve the Quality of Per-Test Fault Diagnosis Using Output Information. 11-24
  
• Ugur Çilingiroglu:
  Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults. 25-34
  
• Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer:
  Isolation of Failing Scan Cells through Convolutional Test Response Compaction. 35-45
  
• Luca Sterpone, Matteo Sonza Reorda, Massimo Violante, Fernanda Lima Kastensmidt, Luigi Carro:
  Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs. 47-54
  
• Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
  Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. 55-74
  
• Wang-Dauh Tseng:
  Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing. 75-84
  
• Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani:
  RF Testing on a Mixed Signal Tester. 85-94
  
• Shalabh Goyal, Abhijit Chatterjee, Michael Purtell:
  A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. 95-106
  

Volume 23, Numbers 2-3, June 2007

• Vishwani D. Agrawal:
  Editorial. 111
  
• Bruce C. Kim:
  Test Technology Newsletter April 2007. 113-114
  
• Mohammad Tehranipoor:
  Guest Editorial. 115-116
  
• Tad Hogg, Greg Snider:
  Defect-tolerant Logic with Nanoscale Crossbar Circuits. 117-129
  
• Jason G. Brown, R. D. (Shawn) Blanton:
  A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. 131-144
  
• Zhanglei Wang, Krishnendu Chakrabarty:
  Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. 145-161
  
• Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi:
  On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire. 163-174
  
• Jia Di, Parag K. Lala:
  Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems. 175-192
  
• Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli:
  QCA Circuits for Robust Coplanar Crossing. 193-210
  
• Mo Liu, Craig S. Lent:
  Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata. 211-218
  
• Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty:
  Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips. 219-233
  
• Wenjing Rao, Alex Orailoglu, Ramesh Karri:
  Towards Nanoelectronics Processor Architectures. 235-254
  
• Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, William R. Patterson, Alexander Zaslavsky:
  Designing Nanoscale Logic Circuits Based on Markov Random Fields. 255-266
  

Volume 23, Number 4, August 2007

• Erik Schüler, Marcelo Ienczczak Erigson, Luigi Carro:
  Functionally Fault-tolerant DSP Microprocessor using Sigma-delta Modulated Signals. 275-292
  
• J. M. Gilbert, Ian M. Bell:
  The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. 293-307
  
• John W. Sheppard, S. G. W. Butcher:
  A Formal Analysis of Fault Diagnosis with D-matrices. 309-322
  
• M. A. El-Gamal, M. D. A. Mohamed:
  Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits. 323-339
  
• Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
  IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. 341-355
  
• Sunghoon Chun, YongJoon Kim, Sungho Kang:
  MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. 357-362
  
• Mohammad Gh. Mohammad, Laila Terkawi:
  Techniques for Disturb Fault Collapsing. 363-368
  

Volume 23, Number 5, October 2007

• Vishwani D. Agrawal:
  Editorial. 369
  
• Bruce C. Kim:
  Test Technology Newsletter - October 2007. 371-372
  
• Franco Fummi, Graziano Pravadelli:
  Too Few or Too Many Properties? Measure it by ATPG! 373-388
  
• Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
  A System-layer Infrastructure for SoC Diagnosis. 389-404
  
• Fatih Kocan, Daniel G. Saab:
  Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware. 405-420
  
• Walid Ibrahim:
  A Novel EDA Tool for VLSI Test Vectors Management. 421-434
  
• Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
  Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. 435-444
  
• Ilia Polian, Hideo Fujiwara:
  Functional Constraints vs. Test Compression in Scan-Based Delay Testing. 445-455
  
• David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre:
  Securing Scan Control in Crypto Chips. 457-464
  

Volume 23, Number 6, December 2007

• Vishwani D. Agrawal:
  Editorial. 465
  
• Bruce C. Kim:
  Test Technology Newsletter - December 2007. 467-468
  
• Marcelo Lubaszewski, Andrew Richardson, C. C. Su:
  Guest Editorial. 469
  
• Ahcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez:
  Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. 471-484
  
• Uros Kac, Franc Novak:
  Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration. 485-495
  
• Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
  Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. 497-512
  
• Carsten Wegener, Michael Peter Kennedy:
  Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. 513-525
  
• Hao-Chiao Hong:
  A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability Sigma-Delta Modulators. 527-538
  
• Daniela De Venuto, Leonardo Reyneri:
  Fast PWM-Based Test for High Resolution SigmaDelta ADCs. 539-548
  
• Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh Chang:
  Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST. 549-558
  
• Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen:
  A Design-Based Structural Test Method for a Switched-Resistor DAC. 559-567
  
• Teuvo Saikkonen, Markku Moilanen:
  Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. 569-579
  
• Jari Hannu, Markku Moilanen:
  Methods of Testing Discrete Semiconductors in the 1149.4 Environment. 581-592
  
• M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret:
  A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications. 593-603
  
• Kay Suenaga, Rodrigo Picos, Sebastià A. Bota, Miquel Roca, Eugeni Isern, Eugenio García:
  A Module for BiST of CMOS RF Receivers. 605-612
  
• Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
  Reducing Test Time Using an Enhanced RF Loopback. 613-623
  
• Cristiano Lazzari, Ricardo A. L. Reis, Lorena Anghel:
  A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis. 625-633