Volume 24, Numbers 1-3, June 2008
Special Issue on Defect and Fault Tolerance; Guest Editors:
Nur A. Touba, Adelio Salsano, and Minsu Choi
, Jiro Kato
: Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method.
, Minsu Choi
: Scalability of Globally Asynchronous QCA (Quantum-Dot Cellular Automata) Adder Design.
Volume 24, Number 4, August 2008
Special Issue on Low Power Test
, Yu Huang
: Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells.
: Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations.
Ho Fai Ko
, Nicola Nicolici
: Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.
Volume 24, Number 5, October 2008
: Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells.
, Zebo Peng
: A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.
Volume 24, Number 6, December 2008
: Self-Testing Embedded Borden t -UED Code Checkers for t = 2 k q - 1 with q = 2 m - 1.