Journal of Electronic Testing, Volume 24

Volume 24, Numbers 1-3, June 2008

Special Issue on Defect and Fault Tolerance; Guest Editors: Nur A. Touba, Adelio Salsano, and Minsu Choi

Volume 24, Number 4, August 2008

Special Issue on Low Power Test

Volume 24, Number 5, October 2008

Volume 24, Number 6, December 2008