Journal of Electronic Testing, Volume 25

Volume 25, Number 1, February 2009

• Vishwani D. Agrawal:
  Editorial. 1
  
• Cristiana Bolchini, Yong-Bin Kim:
  Guest Editorial. 9-10
  
• Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi:
  An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly. 11-23
  
• Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi:
  Healing DNA Self-Assemblies Using Punctures. 25-37
  
• Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi:
  Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. 39-54
  
• Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi:
  Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. 55-66
  
• Rani S. Ghaida, Payman Zarkesh-Ha:
  A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. 67-77
  
• Michele Favalli, Marcello Dalpasso:
  How Many Test Vectors We Need to Detect a Bridging Fault? 79-95
  
• Kazuteru Namba, Yoshikazu Matsui, Hideo Ito:
  Test Compression for IP Core Testing with Reconfigurable Network and Fixing-Flipping Coding. 97-105
  
• Mario García-Valderas, Luis Entrena, Raúl Fernández Cardenal, Celia López-Ongil, Marta Portela-García:
  SET Emulation Under a Quantized Delay Model. 107-116
  
• Waleed K. Al-Assadi, Sindhu Kakarla:
  Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits. 117-126