Journal of Electronic Testing, Volume 25

Volume 25, Number 1, February 2009

• Vishwani D. Agrawal:
  Editorial. 1
  
• Cristiana Bolchini, Yong-Bin Kim:
  Guest Editorial. 9-10
  
• Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi:
  An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly. 11-23
  
• Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi:
  Healing DNA Self-Assemblies Using Punctures. 25-37
  
• Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi:
  Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. 39-54
  
• Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi:
  Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. 55-66
  
• Rani S. Ghaida, Payman Zarkesh-Ha:
  A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. 67-77
  
• Michele Favalli, Marcello Dalpasso:
  How Many Test Vectors We Need to Detect a Bridging Fault? 79-95
  
• Kazuteru Namba, Yoshikazu Matsui, Hideo Ito:
  Test Compression for IP Core Testing with Reconfigurable Network and Fixing-Flipping Coding. 97-105
  
• Mario García-Valderas, Luis Entrena, Raúl Fernández Cardenal, Celia López-Ongil, Marta Portela-García:
  SET Emulation Under a Quantized Delay Model. 107-116
  
• Waleed K. Al-Assadi, Sindhu Kakarla:
  Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits. 117-126
  

Volume 25, Numbers 2-3, June 2009

• Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
  A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash. 127-144
  
• Hao-Chiao Hong, Sheng-Chuan Liang, Hong-Chin Song:
  A Built-in-Self-Test Sigma-Delta ADC Prototype. 145-156
  
• Chenglin Yang, Shulin Tian, Bing Long:
  Test Points Selection for Analog Fault Dictionary Techniques. 157-168
  
• Reza M. Rad, Jim Plusquellic:
  A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals. 169-185
  
• Angel Quiros-Olozabal, Ma de los Angeles Cifredo Chacon:
  A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test. 187-195
  
• Mihir R. Choudhury, Quming Zhou, Kartik Mohanram:
  Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion. 197-207
  

Volume 25, Numbers 4-5, August 2009

• Vishwani D. Agrawal:
  Editorial. 209
  
• Rajeshwary Tayade, Jacob A. Abraham:
  Critical Path Selection for Delay Testing Considering Coupling Noise. 213-223
  
• Mehran Mozaffari Kermani, Arash Reyhani-Masoleh:
  Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard. 225-245
  
• Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
  X-tolerant Test Data Compaction with Accelerated Shift Registers. 247-258
  
• Stefan Holst, Hans-Joachim Wunderlich:
  Adaptive Debug and Diagnosis Without Fault Dictionaries. 259-268
  
• Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
  A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard. 269-278
  
• R. Fernández:
  A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range. 279-283
  

Volume 25, Number 6, December 2009

• Vishwani D. Agrawal:
  Editorial. 285
  
• Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar:
  PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams. 289-300
  
• Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler:
  Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. 301-308
  
• Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
  On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. 309-321
  
• Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
  LPTest: a Flexible Low-Power Test Pattern Generator. 323-335
  
• Fangyuan Nan, Yaonan Wang, Fuhai Li, Weifeng Yang, Xiaoping Ma:
  A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture Model. 337-342
  
• Mary D. Pulukuri, Charles E. Stroud:
  On Built-In Self-Test for Adders. 343-346
  
• Kyuchull Kim, Kewal K. Saluja:
  Low-Area Wrapper Cell Design for Hierarchical SoC Testing. 347-352
  

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