selected papers
Volume 33,
Number 1,
January 1989
Volume 33,
Number 2,
March 1989
Geometric Modeling
Vector Processing
Weighted Random-Pattern Testing
Integrated-Circuit Chip Yield
- Charles H. Stapper:
Large-Area Fault Clusters and Fault Tolerance in VLSI Circuits: A Review.
162-173
Volume 33,
Number 4,
July 1989
Volume 33,
Number 5,
September 1989
Volume 33,
Number 6,
November 1989
Copyright © Fri Dec 4 03:12:02 2009
by Michael Ley (ley@uni-trier.de)