Volume 12, Number 1, 2000
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journals/mva/Yadid-Pecht00 Orly Yadid-Pecht :
Widening the dynamic range of pictures using a minimum spanning tree algorithm. 1-6
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journals/mva/FusielloTV00
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journals/mva/LaptevMLESB00
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Volume 12, Number 2, 2000
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journals/mva/NakanishiO00
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journals/mva/ChatterjeeR00
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Volume 12, Number 3, 2000
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journals/mva/WiltschiPL00
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journals/mva/BoukouvalasP00
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Pin Xie ,
Sheng Uei Guan :
A golden-template self-generating method for patterned wafer inspection. 149-156
Volume 12, Number 4, 2000
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Robert Sablatnig :
Increasing flexibility for automatic visual inspection: the general analysis graph. 158-169
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journals/mva/KatafuchiSOO00
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Toshiharu Mukai ,
Noboru Ohnishi :
A robust eigenspace method for obtaining feature values in high-speed massively parallel vision systems. 197-202
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Volume 12, Number 5, 2001
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Ivan Bajla ,
Igor Holländer :
Geometry-driven-diffusion filtering of magnetic resonance images using model-based conductance. 223-237
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Volume 12, Number 6, 2001
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