Volume 5, Number 1, January 1983
Clifford C. Geschke
: A System for Programming and Controlling Sensor-Based Robot Manipulators.
: Restoration of a Feature Closed Class of Two-Dimensional Images.
: Gray Level Image Processing by Cellular Logic Transforms.
: Direct Computation of the Focus of Expansion.
: Segmenting Dot Patterns by Voronoi Diagram Concavity.
Volume 5, Number 2, March 1983
Ray A. Jarvis
: A Perspective on Range Finding Techniques for Computer Vision.
Rodney A. Brooks
: Model-Based Three-Dimensional Interpretations of Two-Dimensional Images.
Roger Y. Tsai
: Multiframe Image Point Matching and 3-D Surface Reconstruction.
Philip E. Zwicke
, Imre Kiss
: A New Implementation of the Mellin Transform and its Application to Radar Classification of Ships.
: Candide's Practical Principles of Experimental Pattern Recognition.
V. N. Dvornychenko
: Bounds on (Deterministic) Correlation Functions with Application to Registration.
Chul E. Kim
: Three-Dimensional Digital Line Segments.
Volume 5, Number 3, May 1983
Steven A. Vere
: Planning in Time: Windows and Durations for Activities and Goals.
, Song B. Park
: Optimum Recursive Filtering of Noisy Two-Dimensional Data with Sequential Parameter Identification.
: Using Pyramids to Define Local Thresholds for Blob Detection.
Volume 5, Number 4, July 1983
Stanley L. Sclove
: Application of the Conditional Population-Mixture Model to Image Segmentation.
Volume 5, Number 5, September 1983
Perry L. Miller
: ATTENDING: Critiquing a Physician's Management Plan.
, King-Sun Fu
: Parsing and Translation of (Attributed) Expansive Graph Languages for Scene Analysis.
Ray A. Jarvis
: A Laser Time-of-Flight Range Scanner for Robotic Vision.
Volume 5, Number 6, November 1983
W. A. Perkins
: INSPECTOR: A Computer Vision System that Learns to Inspect Parts.
L. F. Pau
: Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits.
Thomas C. Henderson
: Efficient 3-D Object Representations for Industrial Vision Systems.
Michael L. Baird
: GAGESIGHT: A Computer Vision System for Automatic Inspection of Instrument Gauges.