Pattern Recognition, Volume 10

Volume 10, Number 1, 1978

• Pratap N. Misra, S. G. Wheeler:
  Crop classification with LANDSAT multispectral scanner data. 1-13
  
• C. V. Kameswara Rao:
  On fingerprint pattern recognition. 15-18
  
• Daniel Coulon, Daniel Kayser:
  Learning criterion and inductive behaviour. 19-25
  
• Ryuzo Takiyama:
  Multiple threshold perceptron. 27-30
  
• Alexander Keewatin Dewdney:
  Analysis of a steepest-descent image-matching algorithm. 31-39
  
• B. Dasarathy, Lee J. White:
  A characterization of nearest-neighbor rule decision surfaces and a new approach to generate them. 41-46
  
• John C. Turner, Chris P. Tsokos:
  A nonparametric classification scheme with mean squared error criterion. 47-53
  

Volume 10, Number 2, 1978

• G. H. Landeweerd, Edzard S. Gelsema:
  The use of nuclear texture parameters in the automatic analysis of leukocytes. 57-61
  
• J. P. Maroy, Marc Berthod:
  Natural language understanding by a robot: A pattern recognition problem. 63-71
  
• Sjlvano Rivoira, Pietro Torasso:
  An isolated-word recognizer based on grammar-controlled classification processes. 73-84
  
• Anil K. Jain, Richard C. Dubes:
  Feature definition in pattern recognition with small sample size. 85-97
  
• Gerard Gaillat:
  A simple learning decision algorithm for character recognition and pattern classification. 99-104
  
• K. Chidananda Gowda, G. Krishna:
  Agglomerative clustering using the concept of mutual nearest neighbourhood. 105-112
  
• Chris P. Tsokos, R. L. W. Welch:
  Bayes discrimination with mean square error loss. 113-123
  

Volume 10, Number 3, 1978

• Robert M. Haralick:
  Editorial. 127-128
  
• Stephen D. Shapiro:
  Feature space transforms for curve detection. 129-143
  
• Sahibsingh A. Dudani, Anthony L. Luk:
  Locating straight-line edge segments on outdoor scenes. 145-157
  
• Herbert Freeman:
  Shape description via the use of critical points. 159-166
  
• Harry Blum, Roger N. Nagel:
  Shape description using weighted symmetric axis features. 167-180
  
• Azriel Rosenfeld:
  Iterative methods in image analysis. 181-187
  
• Godfried T. Toussaint:
  The use of context in pattern recognition. 189-204
  
• Owen Robert Mitchell, S. G. Carlton:
  Image segmentation using a local extrema texture measure. 205-210
  
• Ned Glick:
  Additive estimators for probabilities of correct classification. 211-222
  
• Robert M. Haralick:
  Structural pattern recognition, homomorphisms, and arrangements. 223-236
  

Volume 10, Number 4, 1978

• Kazumasa Ozawa:
  Simulation of the optical illusions using a spatial filter. 237-242
  
• Gift Siromoney, R. Chandrasekaran, M. Chandrasekaran:
  Computer recognition of printed Tamil characters. 243-247
  
• Monique Pavel:
  A unified setting for projections in pattern recognition. 249-254
  
• Ryuzo Takiyama:
  A general method for training the committee machine. 255-259
  
• Chi Hau Chen:
  Note on a modified gradient method for image analysis. 261-264
  
• K. C. Varghese, J. Hywel Williams, Denis R. Towill:
  Computer aided feature selection for enhanced analogue system fault location. 265-280
  
• Peter J. van Otterloo, I. T. Young:
  A distribution-free geometric upper bound for the probability of error of a minimum distance classifier. 281-286
  
• Margareta Holgersson:
  The limited value of cophenetic correlation as a clustering criterion. 287-295
  
• Pierre A. Devijver:
  A note on ties in voting with the k-NN rule. 297-298
  

Volume 10, Number 5-6, 1978

• L. D. Harmon, S. C. Kuo, P. F. Ramig, U. Raudkivi:
  Identification of human face profiles by computer. 301-312
  
• Linda G. Shapiro:
  Inexact matching of line drawings in a syntactic pattern recognition system. 313-321
  
• Matthew Witten:
  Compactification of information in r-color 2-dimensional rectangular patterns. 323-326
  
• Abe R. Shliferstein, Y. T. Chien:
  Switching components and the ambiguity problem in the reconstruction of pictures from their projections. 327-340
  
• Mabo Robert Ito, T. L. Chui:
  On-line computer recognition of proposed standard ANSI(USASI) handprinted characters. 341-349
  
• G. Leboucher, G. E. Lowitz:
  What a histogram can really tell the classifier. 351-357
  
• G. E. Lowitz:
  Stability and dimensionality of Karhunen-Loeve multispectral image expansions. 359-363
  
• Anil K. Jain, W. G. Waller:
  On the optimal number of features in the classification of multivariate Gaussian data. 365-374
  
• Alberto Apostolico, Eduardo R. Caianiello, Enrico Fischetti, Sergio Vitulano:
  C-calculus: An elementary approach to some problems in pattern recognition . 375-387
  
• Alberto Apostolico, Eduardo R. Caianiello, Enrico Fischetti, Sergio Vitulano:
  An application of C-calculus to texture analysis: C-transforms. 389-396
  
• Devendra Sahal:
  SELF: A framework for generation of patterns. 397-401