Pattern Recognition, Volume 4

Volume 4, Number 1, January 1972

• Robert S. Ledley:
  Editorial comment. 1
  
• K. S. Fu:
  Introduction to special issue on syntactic pattern recognition--part two. 3
  
• Theodosios Pavlidis:
  Representation of figures by labeled graphs. 5-17
  
• Kenneth J. Breeding, John O. Amoss:
  A pattern description language - PADEL. 19-36
  
• John Mylopoulos:
  On the application of formal language and automata theory to pattern recognition. 37-51
  
• Luigia Carlucci:
  A formal system for texture languages. 53-72
  
• J. C. Simon, A. Checroun, C. Roche:
  A method of comparing two patterns independent of possible transformations and small distortions. 73-81
  
• Philip H. Swain, K. S. Fu:
  Stochastic programmed grammars for syntactic pattern recognition. 83-100
  
• I. B. Muchnik:
  Simulation of process of forming the language for description and analysis of the forms of images. 101-140
  

Volume 4, Number 2, May 1972

• Robert S. Ledley:
  Introduction to the special issue on fine particle science. 145
  
• Brian H. Kaye:
  Efficient pattern recognition in fine particle science. 147-150
  
• A. I. Medalia, G. J. Hornik:
  Pattern recognition problems in the study of carbon black. 155-158
  
• E. W. White, Kathy Mayberry, G. G. Johnson Jr.:
  Computer analysis of multi-channel SEM and X-ray images from fine particles. 173-192
  
• Brian H. Kaye, A. G. Naylor:
  An optical information procedure for characterizing the shape of fine particle images. 195-196
  
• C. B. Shelman:
  The application of list processing techniques to picture processing. 201-210
  
• Edward A. Patrick, Joseph Altman, Richard Wild:
  Computer output display of cells and cell features. 211-226
  

Volume 4, Number 3, October 1972

• Robert S. Ledley: About this issue. 233
• John F. Betak:
  Measuring two-dimensional complexity: A conceptual structure. 235-242
  
• Yoshiaki Shirai:
  Recognition of polyhedrons with a range finder. 243-244
  
• Kokichi Tanaka, Kazumasa Ozawa:
  A new type of feature extraction of patterns using coherent optical system. 251-262
  
• David M. Jackson, Lee J. White:
  Effect of random errors on generalized distance computations. 263-273
  
• R. M. Bowman, Eugene S. McVey:
  Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions. 275-288
  
• Tsuguchika Kaminuma, Satosi Watanabe:
  Fast-converging adaptive algorithms for well-balanced separating linear classifier. 289-305
  
• Israel Gitman:
  A parameter-free clustering model. 307-315
  
• Ronald L. Citrenbaum:
  Strategic pattern generation: A solution technique for a class of games. 317-329
  
• William J. Sacco, Wayne S. Copes:
  Reduction of the class of feature evaluation techniques in pattern analysis. 331-332
  

Volume 4, Number 4, December 1972

• Robert S. Ledley:
  About this issue. 341
  
• Yoshiaki Shirai, Saburo Tsuji:
  Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions. 343-344
  
• Sheldon S. Sandler:
  Direct three-dimensional analysis of electron micrograph pictures. 353-359
  
• Oscar Firschein, Martin A. Fischler:
  A study in descriptive representation of pictorial data. 361-366
  
• D. W. Thomas, B. R. Wilkins:
  The analysis of vehicle sounds for recognition. 379-389
  
• Lucio Pietrantonio, Peter C. Jurs:
  Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition. 391-400
  
• Periagaram K. Rajasekaran, Mandyam D. Srinath:
  Unsupervised learning in nongaussian pattern recognition. 401-416