Pattern Recognition, Volume 6

Volume 6, Number 1, June 1974

• L. F. Pau:
  Applications of pattern recognition to the diagnosis of equipment failures. 3-11
  
• J. P. Basu, Patrick L. Odell:
  Effect of intraclass correlation among training samples on the misclassification probabilities of bayes procedure. 13-16
  
• Edwin Diday:
  Optimization in non-hierarchical clustering. 17-33
  
• Lee J. White, A. Art Ksienski:
  Aircraft identification using a bilinear surface representation of radar data. 35-45
  
• E. T. Lee:
  The shape-oriented dissimilarity of polygons and its application to the classification of chromosome images. 47-60
  
• Michael L. Baird, Michael D. Kelly:
  A paradigm for semantic picture recognition. 61-74
  

Volume 6, Number 2, October 1974

• Nebojsa S. Ivancevic:
  Stereometric pattern recognition by artificial touch. 77-83
  
• Paul J. Nahin:
  The theory and measurement of a silhouette descriptor for image pre-processing and recognition. 85-95
  
• William L. Brogan, Allen R. Edison:
  Automatic classification of grains via pattern recognition techniques. 97-103
  
• Frederick Hayes-Roth:
  Schematic classification problems and their solution. 105-113
  
• Gösta H. Granlund:
  Statistical analysis of chromosome characteristics. 115-126
  
• Julian R. Ullmann:
  Binarization using associative addressing. 127-135
  

Volume 6, Number 3-4, December 1974

• W. R. Throssell, P. R. Fryer:
  The measurement of print quality for optical character recognition systems. 141-147
  
• D. J. H. Moore, D. J. Parker:
  Analysis of global pattern features. 149-164
  
• Paulien Hogeweg, Ben Hesper:
  A model study on biomorphological description. 165-179
  
• James R. Slagle, Chin-Liang Chang, Richard C. T. Lee:
  Experiments with some cluster analysis algorithms. 181-187
  
• James Gips:
  A syntax-directed program that performs a three-dimensional perceptual task. 189-199