Pattern Recognition, Volume 6

Volume 6, Number 1, June 1974

• L. F. Pau:
  Applications of pattern recognition to the diagnosis of equipment failures. 3-11
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• J. P. Basu, Patrick L. Odell:
  Effect of intraclass correlation among training samples on the misclassification probabilities of bayes procedure. 13-16
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• Edwin Diday:
  Optimization in non-hierarchical clustering. 17-33
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• Lee J. White, A. Art Ksienski:
  Aircraft identification using a bilinear surface representation of radar data. 35-45
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• E. T. Lee:
  The shape-oriented dissimilarity of polygons and its application to the classification of chromosome images. 47-60
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• Michael L. Baird, Michael D. Kelly:
  A paradigm for semantic picture recognition. 61-74
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Volume 6, Number 2, October 1974

• Nebojsa S. Ivancevic:
  Stereometric pattern recognition by artificial touch. 77-83
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• Paul J. Nahin:
  The theory and measurement of a silhouette descriptor for image pre-processing and recognition. 85-95
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• William L. Brogan, Allen R. Edison:
  Automatic classification of grains via pattern recognition techniques. 97-103
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• Frederick Hayes-Roth:
  Schematic classification problems and their solution. 105-113
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• Gösta H. Granlund:
  Statistical analysis of chromosome characteristics. 115-126
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• Julian R. Ullmann:
  Binarization using associative addressing. 127-135
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Volume 6, Number 3-4, December 1974

• W. R. Throssell, P. R. Fryer:
  The measurement of print quality for optical character recognition systems. 141-147
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• D. J. H. Moore, D. J. Parker:
  Analysis of global pattern features. 149-164
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• Paulien Hogeweg, Ben Hesper:
  A model study on biomorphological description. 165-179
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• James R. Slagle, Chin-Liang Chang, Richard C. T. Lee:
  Experiments with some cluster analysis algorithms. 181-187
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• James Gips:
  A syntax-directed program that performs a three-dimensional perceptual task. 189-199
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