Quality and Reliability Engineering International, Volume 26

Volume 26, Number 1, February 2010

• Douglas C. Montgomery:
  The 25th anniversary volume of Quality and Reliability Engineering International. 1-2
  

• Jeh-Nan Pan, Chun-Yi Lee:
  New capability indices for evaluating the performance of multivariate manufacturing processes. 3-15
  
• Cinzia Mortarino:
  Duncan's model for X-control charts: sensitivity analysis to input parameters. 17-26
  
• Om Prakash Yadav, Sunil S. Bhamare, Ajay Pal Singh Rathore:
  Reliability-based robust design optimization: A multi-objective framework using hybrid quality loss function. 27-41
  
• Sarah E. Marshall, Stefanka Chukova:
  On analysing warranty data from repairable items. 43-52
  
• J. F. Gifun, D. M. Karydas:
  Organizational attributes of Highly Reliable complex systems. 53-62
  
• Jiujun Zhang, Changliang Zou, Zhaojun Wang:
  A control chart based on likelihood ratio test for monitoring process mean and variability. 63-73
  
• Christina A. Hamada, Michael S. Hamada:
  All-subsets regression under effect heredity restrictions for experimental designs with complex aliasing. 75-81
  
• Ben Flood, Brett Houlding, Simon P. Wilson, Sergiy Vilkomir:
  A probability model of system downtime with implications for optimal warranty design. 83-96
  
• Henrik Spliid:
  An exponentially weighted moving average control chart for Bernoulli data. 97-113
  
• M. Tkác, S. Lyócsa:
  On the evaluation of Six Sigma projects. 115-124
  

Volume 26, Number 2, March 2010

• Murat Caner Testik, Doug Montgomery, Aarnout Brombacher:
  Editorial - ENBIS 8th Annual Meeting. 125-126
  

• Heidi Arnouts, Peter Goos, Bradley Jones:
  Design and analysis of industrial strip-plot experiments. 127-136
  
• Christian Dehlendorff, Murat Kulahci, Klaus K. Andersen:
  Analysis of computer experiments with multiple noise sources. 137-146
  
• Hilla Ginsburg, Irad Ben-Gal:
  Optimization-seeking experimentations: Design of an RL-circuit via the vs-optimality criterion. 147-155
  
• Elisabeth Viles, Martín Tanco, Inge Isasa, Unai Arteche, Xabier Sagartzazu:
  Applying Design of Experiments to a lift test rig. 157-165
  
• Marit Schoonhoven, Ronald J. M. M. Does:
  The &Xmacr; control chart under non-normality. 167-176
  
• Canan Pehlivan, Murat Caner Testik:
  Impact of model misspecification on the exponential EWMA charts: a robustness study when the time-between-events are not exponential. 177-190
  

Volume 26, Number 3, April 2010

• Aarnout Brombacher:
  Reliability engineers and dinosaurs.... 191
  

• A. Dieter, K. Pickard, B. Bertsche:
  Periodic renewal of spare parts using Weibull. 193-198
  
• Marion R. Reynolds Jr., Changsoon Park:
  CUSUM charts for detecting special causes in integrated process control. 199-221
  
• P. Angelopoulos, H. Evangelaras, Christos Koukouvinos:
  Analyzing unreplicated 2^k factorial designs by examining their projections into k-1 factors. 223-233
  
• Christopher A. Carolan, John F. Kros, Said E. Said:
  Economic design of Xbar control charts with continuously variable sampling intervals. 235-245
  
• Chen-ju Lin, W. L. Pearn:
  Process selection for higher production yield based on capability index S_pk. 247-258
  
• Søren Bisgaard, Davit Khachatryan:
  Asymptotic confidence intervals for variograms of stationary time series. 259-265
  
• Young-Il Kim, Benjamin M. Adams:
  Multivariate SPC for recipe preservation of batch processes. 267-277
  
• Sung Won Han, Kwok-Leung Tsui, Bancha Ariyajunya, Seoung Bum Kim:
  A comparison of CUSUM, EWMA, and temporal scan statistics for detection of increases in poisson rates. 279-289
  
• Rassoul Noorossana, M. Eyvazian, Amirhossein Amiri, Mahmoud A. Mahmoud:
  Statistical monitoring of multivariate multiple linear regression profiles in phase I with calibration application. 291-303
  
• John S. Lawson, Stephen Manortey:
  Optimal maintenance strategy for Technology-enhanced classrooms: a case study. 305-313
  

Volume 26, Number 4, June 2010

• Murat Kulahci, Don R. Holcomb, Min Xie:
  Editorial. 315
  
• Torben Hasenkamp:
  Engineering Design for Six Sigma - a systematic approach. 317-324
  
• Yihai He, Xiaoqing Tang, Wenbing Chang:
  Technical decomposition approach of critical to quality characteristics for Product Design for Six Sigma. 325-339
  
• Benjamin Kemper, Jeroen de Mast, Michel Mandjes:
  Modeling process flow using diagrams. 341-349
  
• Hendry Raharjo, Aarnout Brombacher, T. N. Goh, Bo Bergman:
  On integrating Kano's model dynamics into QFD for multiple product design. 351-363
  
• T. N. Goh, S. W. Lam:
  Problem-based learning approach to application of statistical experimentation. 365-373
  
• Shilpa Gupta, Murat Kulahci, Douglas C. Montgomery, Connie M. Borror:
  Analysis of signal-response systems using generalized linear mixed models. 375-385
  

• Kuo-Liang Lee, Chun-Chin Wei:
  Reducing mold changing time by implementing Lean Six Sigma. 387-395
  

Volume 26, Number 5, July 2010

• Aarnout Brombacher:
  Reliability prediction and 'Deepwater Horizon'; lessons learned. 397
  

• Marcus B. Perry:
  Identifying the time of polynomial drift in the mean of autocorrelated processes. 399-415
  
• In-Jun Jeong, Kwang-Jae Kim, Dennis K. J. Lin:
  Bayesian analysis for weighted mean-squared error in dual response surface optimization. 417-430
  
• Rachel T. Johnson, Douglas C. Montgomery:
  Designing experiments for nonlinear models - an introduction. 431-441
  
• Vijay Kumar Butte, Loon Ching Tang:
  Multivariate charting techniques: a review and a line-column approach. 443-451
  
• Marion R. Reynolds Jr., Zachary G. Stoumbos:
  Robust CUSUM charts for monitoring the process mean and variance. 453-473
  
• Jyh-Jen Horng Shiau, Jian-Huang Sun:
  A new strategy for Phase I analysis in SPC. 475-486
  
• T. N. Goh:
  An information management paradigm for statistical experiments. 487-494
  

• Erik Vanhatalo:
  Multivariate process monitoring of an experimental blast furnace. 495-508
  
• Amirhossein Amiri, Willis A. Jensen, Reza B. Kazemzadeh:
  A case study on monitoring polynomial profiles in the automotive industry. 509-520
  

Volume 26, Number 6, October 2010

• Douglas C. Montgomery:
  Trouble at Toyota. 521
  

• Fausto Pedro García Márquez, Isidro Peña García-Pardo:
  Principal component analysis applied to filtered signals for maintenance management. 523-527
  
• Chang-Xing Ma, Ming-Yao Ai, L. Y. Chan, T. N. Goh:
  Three-level and mixed-level orthogonal arrays for lean designs. 529-539
  
• Zhang Wu, Yafen Liu, Zhen He, Michael B. C. Khoo:
  A Cumulative Sum scheme for monitoring frequency and size of an event. 541-554
  
• Guney Ozsan, Murat Caner Testik, Christian H. Weiß:
  Properties of the exponential EWMA chart with parameter estimation. 555-569
  
• J. Zanoff, S. Ekwaro-Osire:
  An approach that can quickly assess product reliability. 571-578
  
• Bahman Honari, John Donovan, Toby Joyce, Simon Wilson, Eamonn Murphy:
  Stress test optimization using an integrated production test and field reliability model. 579-592
  
• Fiorenzo Franceschini, Domenico A. Maisano:
  A survey of Quality Engineering-Management journals by bibliometric indicators. 593-604
  
• P. Lantiéri, F. Guérin, R. Hambli:
  Reliability estimation by ALT when no analytical model holds. 605-613
  
• Fu-Kwun Wang, Y. F. Cheng:
  EM algorithm for estimating the Burr XII parameters with multiple censored data. 615-630
  
• Arthur B. Yeh, Longcheen Huwang, Richard N. McGrath, Zhe Zhang:
  On monitoring process variance with individual observations. 631-641
  

Volume 26, Number 7, November 2010

• Jing Li, Fugee Tsung:
  Editorial - INFORMS 2009 annual meeting. 643-644
  

• Jian Liu:
  Variation reduction for multistage manufacturing processes: a comparison survey of statistical-process-control vs stream-of-variation methodologies. 645-661
  
• Helen Meyers Bush, Panitarn Chongfuangprinya, Victoria C. P. Chen, Thuntee Sukchotrat, Seoung Bum Kim:
  Nonparametric multivariate control charts based on a linkage ranking algorithm. 663-675
  
• Zhiguo Li, Shiyu Zhou, Crispian Sievenpiper, Suresh Choubey:
  Change detection in the Cox Proportional Hazards models from different reliability data. 677-689
  
• Ping Jiang, Jae-Hak Lim, Ming J. Zuo, Bo Guo:
  Reliability estimation in a Weibull lifetime distribution with zero-failure field data. 691-701
  
• Yong Lei, Dragan Djurdjanovic, Jun Ni:
  DeviceNet reliability assessment using physical and data link layer parameters. 703-715
  
• Rajesh Ganesan, Poornima Balakrishna, Lance Sherry:
  Improving quality of prediction in highly dynamic environments using approximate dynamic programming. 717-732
  
• Andrew R. Conn, Léa Amandine Deleris, Jonathan R. M. Hosking, Tom Anders Thorstensen:
  A simulation model for improving the maintenance of high cost systems, with application to an offshore oil installation. 733-748
  
• O. Arda Vanli, Chuck Zhang, Li-Jen Chen, Kan (Kevin) Wang, Ben Wang:
  A Bayesian approach for integration of physical and computer experiments for quality improvement in nano-composite manufacturing. 749-764
  
• Hyun-Jin Kim, Kwang-Jae Kim, Doh-Soon Kwak:
  A case study on modeling and optimizing photolithography stage of semiconductor fabrication process. 765-774
  
• Anantanat Kantanyarat, Jionghua (Judy) Jin:
  Tooling adjustment strategy for acceptable product quality in assembly processes. 775-785
  

Volume 26, Number 8, December 2010

• Rainer Göb:
  Ten years of advances in business and industrial statistics. 787
  

• Henry Wynn, Irena Ograjensek:
  Is statistics becoming the number one discipline for business and industry? 789-793
  

• Christian H. Weiß, Martin Atzmüller:
  EWMA control charts for monitoring binary processes with applications to medical diagnosis data. 795-805
  
• Claus Weihs, Amor Messaoud, Nils Raabe:
  Control charts based on models derived from differential equations. 807-816
  
• Banu Yuksel Ozkaya, Murat Caner Testik:
  On the expected parts per million nonconforming levels obtained from estimated process capability indices. 817-829
  
• Tiago J. Rato, Marco S. Reis:
  Statistical monitoring of control loops performance: an improved historical-data benchmark index. 831-844
  
• Jan M. Myszewski:
  Mathematical model of the occurrence of human error in manufacturing processes. 845-851
  
• Pasquale Erto, Antonio Lanzotti, Antonio Lepore:
  Wind speed parameter estimation from one-month sample via Bayesian approach. 853-862
  
• Xiao Liu, Loon-Ching Tang:
  A Bayesian optimal design for accelerated degradation tests. 863-875
  
• Nikolaus Haselgruber, Karin Mautner, Jan Thiele:
  Usage space analysis for reliability testing. 877-885
  
• Silvia Figini, Ron S. Kenett, Silvia Salini:
  Optimal scaling for risk assessment: merging of operational and financial data. 887-897
  
• Florian Sobieczky, Gerhard Rappitsch, Ernst Stadlober:
  Tandem queues for inventory management under random perturbations. 899-907
  
• Petra Perner, Anja Attig:
  Fuzzy conceptual clustering. 909-922
  

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