Quality and Reliability Engineering International, Volume 27

Volume 27, Number 1, February 2011

• Aarnout Brombacher:
  Vulnerability. 1
  

• Itay Negrin, Yisrael Parmet, Edna Schechtman:
  Developing a sampling plan based on Cpk - unknown variance. 3-14
  
• Francis Pascual, Huifang Zhang:
  Monitoring the Weibull shape parameter by control charts for the sample range. 15-25
  
• Dae-Heung Jang, Christine M. Anderson-Cook:
  Fraction of design space plots for evaluating ridge estimators in mixture experiments. 27-34
  
• Marcus B. Perry, Gary R. Mercado, Joseph J. Pignatiello Jr.:
  Phase II monitoring of covariance stationary autocorrelated processes. 35-45
  
• Wen Wan, Jeffrey B. Birch:
  A semiparametric technique for the multi-response optimization problem. 47-59
  
• Mark E. Johnson, Bradley Jones:
  Classical design structure of orthogonal designs with six to eight factors and sixteen runs. 61-70
  

• Sharareh Taghipour, Dragan Banjevic, Andrew K. S. Jardine:
  Reliability analysis of maintenance data for complex medical devices. 71-84
  
• A. A. Sunethra, M. R. Sooriyarachchi:
  Variance-corrected proportional hazard models for the analysis of multiple failures in personal computers. 85-97
  
• Daniel R. Rand, James A. McLinn:
  Analysis of field failure data when modeled Weibull slope increases with time. 99-105
  
• Susana Barceló, Santiago Vidal-Puig, Alberto Ferrer:
  Comparison of multivariate statistical methods for dynamic systems modeling. 107-124
  

Volume 27, Number 2, March 2011

• Alireza Faraz, Erwin Saniga:
  Economic statistical design of a T² control chart with double warning lines. 125-139
  
• Man Cheol Kim, Jinkyun Park:
  Development of a path model for human-induced unplanned reactor trips in nuclear power plants. 141-147
  
• George Nenes, Sofia Panagiotidou:
  A Bayesian model for the joint optimization of quality and maintenance decisions. 149-163
  
• Johannes Ledolter, Søren Bisgaard:
  Challenges in constructing time series models from process data. 165-178
  
• Lu Lu, Christine M. Anderson-Cook:
  Using age and usage for prediction of reliability of an arbitrary system from a finite population. 179-190
  
• Haiping Zhu, Fanmao Liu, Xinyu Shao, Qiong Liu, Yuhao Deng:
  A cost-based selective maintenance decision-making method for machining line. 191-201
  
• Fu-Kwun Wang, Tao-Peng Chu:
  The mean time between failures for an LCD panel. 203-208
  
• Ahmed Z. Al-Garni, Ahmad Jamal:
  Artificial neural network application of modeling failure rate for Boeing 737 tires. 209-219
  

• T. N. Goh:
  Six Sigma in industry: some observations after twenty-five years. 221-227
  

• Rong Pan, Taeho Crispin:
  A hierarchical modeling approach to accelerated degradation testing data analysis: A case study. 229-237
  
• Fanmao Liu, Haiping Zhu, Xinyu Shao, Guibing Gao:
  Analysis of horizontal machining center field failure data based on generalized linear mixed model - a case study. 239-248
  

Volume 27, Number 3, April 2011

• Douglas C. Montgomery:
  Important research themes from volume 26 2010. 249-250
  

• Bong-Jin Yum, Kwan-Woo Kim:
  A bibliography of the literature on process capability indices: 2000-2009. 251-268
  
• Huifen Chen, Yikung Pao:
  The joint economic-statistical design of X and R charts for nonnormal data. 269-280
  
• M. Eyvazian, Rassoul Noorossana, Abbas Saghaei, Amirhossein Amiri:
  Phase II monitoring of multivariate multiple linear regression profiles. 281-296
  
• Paul L. Goethals, Byung Rae Cho:
  The development of a target-focused process capability index with multiple characteristics. 297-311
  
• Giovanni Celano, Philippe Castagliola, Enrico Trovato, Sergio Fichera:
  Shewhart and EWMA t control charts for short production runs. 313-326
  
• Jing Li, Hairong Xie, Jionghua Jin:
  Optimal process adjustment by integrating production data and design of experiments. 327-336
  
• Hyun Cheol Lee, Daniel W. Apley:
  Improved design of robust exponentially weighted moving average control charts for autocorrelated processes. 337-352
  
• Lulu Kang, William A. Brenneman:
  Product defect rate confidence bound with attribute and variable data. 353-368
  

• Fred Spiring:
  Exploring process capability with Mathematica. 369-387
  

Volume 27, Number 4, June 2011

• Aarnout Brombacher:
  Fukushima; about risks, reliability and robust design. 389
  

• Walid Gani, Hassen Taleb, Mohamed Limam:
  An assessment of the kernel-distance-based multivariate control chart through an industrial application. 391-401
  
• Paul L. Goethals, Byung Rae Cho:
  The development of a robust design methodology for time-oriented dynamic quality characteristics with a target profile. 403-414
  
• Muhammad Riaz, Nasir Abbas, Ronald J. M. M. Does:
  Improving the performance of CUSUM charts. 415-424
  
• Rassoul Noorossana, A. Vaghefi, M. Dorri:
  Effect of non-normality on the monitoring of simple linear profiles. 425-436
  
• Taha Hossein Hejazi, Mahdi Bashiri, Kazem Noghondarian, Anthony C. Atkinson:
  Multiresponse optimization with consideration of probabilistic covariates. 437-449
  
• Shuohui Chen, Harriet Black Nembhard:
  A high-dimensional control chart for profile monitoring. 451-464
  
• Mahmoud I. Awad, Jamison V. Kovach:
  Multiresponse optimization using multivariate process capability index. 465-477
  
• T. Kevin White, Connie M. Borror:
  Two-dimensional guidelines for measurement system indices. 479-487
  
• Guillermo de León, Pere Grima, Xavier Tort-Martorell:
  Selecting control factor values in a robust design using a scatter plot. 489-497
  
• Ahmad Ostadsharif Memar, Seyed Taghi Akhavan Niaki:
  The Max EWMAMS control chart for joint monitoring of process mean and variance with individual observations. 499-514
  
• Qiang Liu, Jinglun Zhou, Guang Jin, Quan Sun, Min Xi:
  FaBSR: a method for cluster failure prediction based on Bayesian serial revision and an application to LANL cluster. 515-527
  
• Liang Qu, Zhang Wu, Tien-I. Liu:
  A control scheme integrating the T chart and TCUSUM chart. 529-539
  
• Shun Matsuura, Hideo Suzuki, Takahisa Iida, Hirotaka Kure, Hatsuo Mori:
  Robust parameter design using a supersaturated design for a response surface model. 541-554
  
• Gunther Steenackers, Rino Versluys, Mark Runacres, Patrick Guillaume:
  Reliability-based design optimization of computation-intensive models making use of response surface models. 555-568
  
• Selda Kapan Ulusoy, Thomas A. Mazzuchi, Dror Perlstein:
  Bayesian calculation of optimal burn-in time using the joint criteria of cost and delivered reliability. 569-580
  

• Sehee Lee, Jeongsam Yang, Gwangsub Kim:
  Establishment of an effective product liability prevention plan by analyzing product liability cases. 581-593
  
• Eric M. Monroe, Rong Pan, Christine M. Anderson-Cook, Douglas C. Montgomery, Connie M. Borror:
  A generalized linear model approach to designing accelerated life test experiments. 595-607
  

Volume 27, Number 5, July 2011

• Ron S. Kenett:
  The ENBIS10 Quality and Reliability Engineering International special issue. 609
  
• Marianne Frisén:
  Methods and evaluations for surveillance in industry, business, finance, and public health. 611-621
  
• Y. Adler, V. Shper, O. Maksimova:
  Assignable causes of variation and statistical models: another approach to an old topic. 623-628
  
• Marion J. Chatfield, Phil J. Borman, Ivana Damjanov:
  Evaluating change during pharmaceutical product development and manufacture - comparability and equivalence. 629-640
  
• Stelios Psarakis:
  The use of neural networks in statistical process control charts. 641-650
  
• B. Palumbo, G. De Chiara, F. Sansone, R. Marrone:
  Technological scenarios of variation transmission in multistage machining processes. 651-658
  
• Rainer Göb:
  Estimating value at risk and conditional value at risk for count variables. 659-672
  
• L. Deldossi, D. Zappa:
  Measurement uncertainty with nested mixed effect models. 673-679
  
• Michal Shauly, Yisrael Parmet:
  Comparison of Pearson distribution system and response modeling methodology (RMM) as models for process capability analysis of skewed data. 681-687
  
• Martina Erdbrügge, Sonja Kuhnt, Nikolaus Rudak:
  Joint optimization of independent multiple responses. 689-703
  
• Chris McCollin, Irena Ograjensek, Rainer Göb, Andrea Ahlemeyer-Stubbe:
  SERVQUAL and the process improvement challenge. 705-717
  
• M. Emmett, P. Goos, E. C. Stillman:
  A weighted prediction-based selection criterion for response surface designs. 719-729
  

Volume 27, Number 6, October 2011

• John L. Szarka III, William H. Woodall:
  A Review and perspective on surveillance of Bernoulli processes. 735-752
  

• Emese Vágó, Sándor Kemény:
  A model-based approach for attribute gauge analysis. 753-769
  
• Richard K. Burdick, Valerie Pferdeort, Leslie Sidor, Arun Tholudur:
  A graphical representation for a statistical test of average equivalence and variance comparison with process data. 771-780
  
• Sun Quan, Paul H. Kvam:
  Multi-cause degradation path model: a case study on rubidium lamp degradation. 781-793
  
• Raymond R. Hill, Derek A. Leggio, Shay R. Capehart, August G. Roesener:
  Examining improved experimental designs for wind tunnel testing using Monte Carlo sampling methods. 795-803
  
• Mónica A. López-Campos, Adolfo Crespo Marquez:
  Modelling a maintenance management framework based on PAS 55 standard. 805-820
  
• Nasir Abbas, Muhammad Riaz, Ronald J. M. M. Does:
  Enhancing the performance of EWMA charts. 821-833
  
• Naveen Kumar, Christina Mastrangelo, Doug Montgomery:
  Hierarchical modeling using generalized linear models. 835-842
  

• Yu-Ching Chang, Christina Mastrangelo:
  Addressing multicollinearity in semiconductor manufacturing. 843-854
  

Volume 27, Number 7, November 2011

• Aarnout Brombacher:
  Reliability versus commercial pressure. 855
  

• Shoja'eddin Chenouri, Asokan Mulayath Variyath:
  A comparative study of phase II robust multivariate control charts for individual observations. 857-865
  
• Su-Fen Yang, Smiley W. Cheng:
  A new non-parametric CUSUM mean chart. 867-875
  
• Yi Dai, Yunzhao Luo, Zhonghua Li, Zhaojun Wang:
  A new adaptive CUSUM control chart for detecting the multivariate process mean. 877-884
  
• Amit Shinde, George Church, Mani Janakiram, George C. Runger:
  Feature extraction and classification models for high-dimensional profile data. 885-893
  
• Hirokazu Ozaki, Atsushi Kara, Zixue Cheng:
  Service-level assurance in high-availability multi-unit systems using the M-for-N backup scheme. 895-903
  
• Francis Pascual, Diem Nguyen:
  Moving range charts for monitoring the Weibull shape parameter with single observation samples. 905-919
  
• Armando J. Ríos, James R. Simpson, Yong Guo:
  Semifold plans for mixed-level designs. 921-929
  
• Osman Turan, Iraklis Lazakis, S. Judah, A. Incecik:
  Investigating the reliability and criticality of the maintenance characteristics of a diving support vessel. 931-946
  
• Nandan Sudarsanam, Daniel D. Frey:
  Using ensemble techniques to advance adaptive one-factor-at-a-time experimentation. 947-957
  
• Shen Lijuan, Yang Jun, Zhao Yu:
  An integration design optimization framework of robust design, axiomatic design, and reliability-based design. 959-968
  

• Fiorenzo Franceschini, Domenico A. Maisano:
  Influence of database mistakes on journal citation analysis: remarks on the paper by Franceschini and Maisano, QREI (2010). 969-976
  

Volume 27, Number 8, December 2011

• Michael B. C. Khoo, V. H. Wong, Zhang Wu, Philippe Castagliola:
  Optimal designs of the multivariate synthetic chart for monitoring the process mean vector based on median run length. 981-997
  
• Fang Li, George Church, Mani Janakiram, Howard Gholston, George C. Runger:
  Fault detection for batch monitoring and discrete wavelet transforms. 999-1008
  
• David J. Edwards, David H. Q. Truong:
  A comparison of designs for one-step screening and response surface estimation. 1009-1024
  
• Christopher J. Nachtsheim, Kevin E. Becker:
  When is R² appropriate for comparing customer and supplier measurement systems? 1025-1031
  
• Muhammad Riaz:
  An improved control chart structure for process location parameter. 1033-1041
  
• Binchao Chen, Timothy I. Matis, James Benneyan:
  Improved one-sided control charts for the mean of a positively skewed population using truncated saddlepoint approximations. 1043-1058
  
• Muhammad Riaz, Rashid Mehmood, Ronald J. M. M. Does:
  On the performance of different control charting rules. 1059-1067
  
• Ahmad Ostadsharif Memar, Seyed Taghi Akhavan Niaki:
  Multivariate variability monitoring using EWMA control charts based on squared deviation of observations from target. 1069-1086
  
• Linda Lee Ho, Roberto da Costa Quinino, Anderson Laécio Galindo Trindade:
  An np-control chart for inspection errors and repeated classifications. 1087-1093
  
• Jeroen de Mast, Benjamin Kemper, Ronald J. M. M. Does, Michel Mandjes, Yohan van der Bijl:
  Process improvement in healthcare: overall resource efficiency. 1095-1106
  
• David J. Edwards, Jeffrey N. Fuerte:
  Compromise ascent directions for multiple-response applications. 1107-1118
  
• Wen Lea Pearn, J.-J. H. Shiau, Y. T. Tai, M. Y. Li:
  Capability assessment for processes with multiple characteristics: A generalization of the popular index C_pk. 1119-1129
  
• Gary R. Mercado, Michael D. Conerly, Marcus B. Perry:
  Phase I control chart based on a kernel estimator of the quantile function. 1131-1144
  
• V. N. Aju kumar, O. P. Gandhi:
  Quantification of human error in maintenance using graph theory and matrix approach. 1145-1172
  
• Wen Wan, Jeffrey B. Birch:
  Using a modified genetic algorithm to find feasible regions of a desirability function. 1173-1182
  
• Itay Negrin, Yisrael Parmet, Edna Schechtman:
  Developing a model-based sampling plan. 1183-1198
  
• Theodore T. Allen, Shih-Hsien Tseng:
  Variance plus bias optimal response surface designs with qualitative factors applied to stem choice modeling. 1199-1210
  
• Mianbin Zheng, Guohua Chen:
  An effective sensitivity analysis methodology for the reliability-based structural optimization design to high temperature components. 1211-1220
  

• E. V. Gijo, Johny Scaria, Jiju Antony:
  Application of six sigma methodology to reduce defects of a grinding process. 1221-1234
  

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