Software Quality Journal, Volume 10

Volume 10, Number 1, July 2002

• James M. Bieman:
  In This Issue. 5-6
  
• James M. Bieman:
  Editorial: Risks to Software Quality. 7-9
  
• John Moses, Malcolm Farrow, Peter Smith:
  Statistical Methods for Predicting and Improving Cohesion Using Information Flow: An Empirical Study. 11-46
  
• William G. Tuohey:
  Benefits and Effective Application of Software Engineering Standards. 47-68
  
• Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan:
  A General Model of Unit Testing Efficacy. 69-92
  

Volume 10, Number 2, September 2002

• Margaret Ross:
  In This Issue. 99-100
  
• Ita Richardson:
  SPI Models: What Characteristics are Required for Small Software Development Companies? 101-114
  
• Jonathan Vincent, Graham King, Peter Lay, John Kinghorn:
  Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems. 115-133
  
• John Moses:
  Measuring Effort Estimation Uncertainty to Improve Client Confidence. 135-148
  
• Boris I. Cogan, Elena Shalfeeva:
  A Generalized Structural Model of Structured Programs for Software Metrics Definition. 149-167
  
• Kerstin V. Siakas, Elli Georgiadou:
  Empirical Measurement of the Effects of Cultural Diversity on Software Quality Management. 169-180
  
• Mercedes Ruiz, Isabel Ramos, Miguel Toro:
  A Dynamic Integrated Framework for Software Process Improvement. 181-194
  

Volume 10, Number 3, November 2002

• James M. Bieman:
  In This Issue. 199-200
  
• James M. Bieman:
  Editorial: Why Good Software Goes Bad. 201-203
  
• Jessica Chen, Suganthan Subramaniam:
  Specification-based Testing for Gui-based Applications. 205-224
  
• Anneliese Amschler Andrews, Chunhui Zhu, Michael Scheetz, Eric Dahlman, Adele E. Howe:
  AI Planner Assisted Test Generation. 225-259
  
• José Antonio Calvo-Manzano Villalón, Gonzalo Cuevas Agustín, Tomás San Feliu Gilabert, Antonio de Amescua Seco, Luis García Sánchez, Manuel Pérez Cota:
  Experiences in the Application of Software Process Improvement in SMES. 261-273
  

Volume 10, Number 4, December 2002

• James M. Bieman:
  In This Issue. 279-280
  
• Margaret Ross:
  Editorial: The Y2K Legacy-The Time Bomb of Tomorrow. 281-283
  
• Margaret Ross:
  Quality in Web Design for Visually Impaired Users. 285-298
  
• Catherine Stringfellow, Anneliese Amschler Andrews:
  Deriving a Fault Architecture to Guide Testing. 299-330
  
• Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider Ali Ramadhan:
  Critical Analysis of the PIE Testability Technique. 331-354
  
• Alexander Chatzigeorgiou, George Stephanides:
  Energy Metric for Software Systems. 355-371
  

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