Giovanni Ghione, Fabio Filicori: A computationally efficient unified approach to the numerical analysis of the sensitivity and noise of semiconductor devices. 425-438
Frederic Mailhot, Giovanni De Micheli: Algorithms for technology mapping based on binary decision diagrams and on Boolean operations. 599-620
Tsutomu Sasao: EXMIN2: a simplification algorithm for exclusive-OR-sum-of-products expressions for multiple-valued-input two-valued-output functions. 621-632
Michael C. McFarland: Formal verification of sequential hardware: a tutorial. 633-654
Wolfgang Kunz, Dhiraj K. Pradhan: Accelerated dynamic learning for test pattern generation in combinational circuits. 684-694
Adit D. Singh, C. Mani Krishna: On optimizing VLSI testing for product quality using die-yield prediction. 695-709
Donald L. Dietmeyer: Generating minimal covers of symmetric functions. 710-713
Martine D. F. Schlag, Pak K. Chan, Jackson Kong: Empirical evaluation of multilevel logic minimization tools for a lookup-table-based field-programmable gate array technology. 713-722
Srinivas Devadas: Comparing two-level and ordered binary decision diagram representations of logic functions. 722-723
Jason Cong, Bryan Preas, C. L. Liu: Physical models and efficient algorithms for over-the-cell routing in standard cell design. 723-734
Ruchir Puri, Jun Gu: An efficient algorithm to search for minimal closed covers in sequential machines. 737-745
Meinhard Paffrath, Karl Steger: Method of temporary coordinate domains for moving boundary value problems [semiconductor processing simulation]. 746-756
Yang Cai, Martin D. F. Wong: On minimizing the number of L-shaped channels in building-block layout [VLSI]. 757-769
Neven Orhanovic, Paul Wang, Vijay K. Tripathi: Time-domain simulation of uniform and nonuniform multiconductor lossy lines by the method of characteristics. 900-904
Anastasios Vergis: On the multiple-fault testability of generalized counters. 905-909
Noriyuki Iwamuro, Saburo Tagami: Two-dimensional power device simulator considering an integral external circuit equation. 909-912
Hyunwoo Cho, Gary D. Hachtel, Fabio Somenzi: Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration. 935-945
Irith Pomeranz, Sudhakar M. Reddy: 3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits. 1050-1058
Kuo-En Chang: Efficient algorithms of wiring channels with movable terminals. 1059-1063
Lori E. Lucke, Keshab K. Parhi: Data-flow transformations for critical path time reduction in high-level DSP synthesis. 1063-1068
Arlynn W. Smith, Ajeet Rohatgi: Non-isothermal extension of the Scharfetter-Gummel technique for hot carrier transport in heterostructure simulations. 1515-1523
Thyagaraju R. Damarla, Avinash Sathaye: Applications of one-dimensional cellular automata and linear feedback shift registers for pseudo-exhaustive testing. 1580-1591
Daniel Brand: Exhaustive simulation need not require an exponential number of tests. 1635-1641
Gabriele Saucier, Pierre Abouzeid: Lexicographical expressions of Boolean functions with application to multilevel synthesis. 1642-1654
Ingo Schäfer, Marek A. Perkowski: Synthesis of multilevel multiplexer circuits for incompletely specified multioutput Boolean functions with mapping to multiplexer based FPGA's. 1655-1664
Nancy Hitschfeld-Kahler, Paolo Conti, Wolfgang Fichtner: Mixed element trees: a generalization of modified octrees for the generation of meshes for the simulation of complex 3-D semiconductor device structures. 1714-1725
M. A. Styblinski, Syed A. Aftab: Combination of interpolation and self-organizing approximation techniques-a new approach to circuit performance modeling. 1775-1785