Volume 8, Number 1, January 1989
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S. S.-S. Chung :
A charge-based capacitance model of short-channel MOSFETs. 1-7
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journals/tcad/NishiSKUMU89
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Pramod V. Argade :
Sizing an inverter with a precise delay: generation of complementary signals with minimal skew and pulsewidth distortion in CMOS. 33-40
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journals/tcad/HoranLMCL89
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journals/tcad/KrasniewskiP89
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Volume 8, Number 2, February 1989
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Eddie van Schie ,
Jan Middelhoek :
Two methods to improve the performance of Monte Carlo simulations of ion implantation in amorphous targets. 108-113
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journals/tcad/AgrawalCA89
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journals/tcad/VijayanCW89
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Volume 8, Number 3, March 1989
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journals/tcad/Sytrzycki89 M. Sytrzycki :
Modeling of gate oxide shorts in MOS transistors. 193-202
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journals/tcad/Nicolaidis89 Michael Nicolaidis :
Self-exercising checkers for unified built-in self-test (UBIST). 203-218
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journals/tcad/GonzalezK89
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Ludo Weyten ,
Wim De Pauw :
Quad list quad trees: a geometrical data structure with improved performance for large region queries. 229-233
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journals/tcad/JayakumarTS89
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journals/tcad/DagenaisR89
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journals/tcad/BushnellD89
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Wayne Wolf :
How to build a hardware description and measurement system on an object-oriented programming language. 288-301
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Evangelos Simoudis :
A knowledge-based system for the evaluation and redesign of digital circuit networks. 302-315
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journals/tcad/TalkhanAS89
Volume 8, Number 4, April 1989
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journals/tcad/Goodwin-JohanssonSFM89
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journals/tcad/MulvaneyRC89
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journals/tcad/VenturiSSPR89
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journals/tcad/CoughranFG89
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Walter R. Curtice :
Intrinsic GaAs MESFET equivalent circuit models generated from two-dimensional simulations. 395-402
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journals/tcad/ChandrasekharB89
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Volume 8, Number 5, May 1989
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journals/tcad/BurglerBFS89
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journals/tcad/CiampoliniFPGRB89
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journals/tcad/GardnerJR89
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Niraj K. Jha :
Separable codes for detecting unidirectional errors. 571-574
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journals/tcad/Mowchenko89 J. T. Mowchenko :
A lower bound on channel density after global routing. 574-577
Volume 8, Number 6, June 1989
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journals/tcad/UmimotoONE89
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journals/tcad/Chowdhury89 S. Chowdhury :
Analytical approaches to the combinatorial optimization in linear placement problems. 630-639
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journals/tcad/El-TurkyP89
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journals/tcad/AnderssonP89
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Volume 8, Number 7, July 1989
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journals/tcad/VandelooS89
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Shiuh-Wuu Lee :
Universality of mobility-gate field characteristics of electrons in the inversion charge layer and its application in MOSFET modeling. 724-730
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Niraj K. Jha :
A totally self-checking checker for Borden's code. 731-736
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journals/tcad/Bar-YehudaFPW89
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H. Cai :
On empty rooms in floorplan graphics: comments on a deficiency in two papers. 795-797
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journals/tcad/DrusinskyH89
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journals/tcad/RajsumanMJ89
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H. L. Kwok :
Threshold voltage for GaAs MESFET with a recoil-implanted channel profile. 817-820
Volume 8, Number 8, August 1989
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journals/tcad/McMackenC89
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Rex E. Lowther :
A discretization scheme that allows coarse grid-spacing in finite-difference process simulation. 837-841
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journals/tcad/HortensiusMPMC89
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journals/tcad/SarrafzadehL89
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Volume 8, Number 9, September 1989
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journals/tcad/LombardiSS89
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journals/tcad/TakamatsuK89
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journals/tcad/Chakravarty89
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journals/tcad/VandeweerdCRSM89
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journals/tcad/GurunathB89
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Hideo Fujiwara :
Enhancing random-pattern coverage of programmable logic arrays via masking technique. 1022-1025
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Çetin Kaya Koç ,
P. F. Ordung :
Schwarz-Christoffel transformation for the simulation of two-dimensional capacitance [VLSI circuits]. 1025-1027
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Volume 8, Number 10, October 1989
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Mehmet A. Cirit :
The Meyer model revisited: why is charge not conserved? [MOS transistor]. 1033-1037
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C.-P. Wan ,
B. J. Sheu :
Temperature dependence modeling for MOS VLSI circuit simulation. 1065-1073
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journals/tcad/DevadasMNS89
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Volume 8, Number 11, November 1989
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journals/tcad/DamianiOFR89
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journals/tcad/PitaksanonkulTL89
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journals/tcad/DevadasN89a
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Sandip Kundu :
Design of multioutput CMOS combinational logic circuits for robust testability. 1222-1226
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Volume 8, Number 12, December 1989
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Miriam Leeser :
Reasoning about the function and timing of integrated circuits with interval temporal logic. 1233-1246
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journals/tcad/HarjaniRC89
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journals/tcad/LindermanRG89
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journals/tcad/SadayappanV89
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Charles H. Stapper :
Simulation of spatial fault distributions for integrated circuit yield estimations. 1314-1318
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journals/tcad/ZemanianTJJ89
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