Volume 9, Number 1, January 1990
- Chin-Long Wey, Tsin-Yuan Chang:
An efficient output phase assignment for PLA minimization.
1-7

- Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli:
Irredundant sequential machines via optimal logic synthesis.
8-18

- Prathima Agrawal, William J. Dally:
A hardware logic simulation system.
19-29

- David M. Lewis:
Device model approximation using 2N trees.
30-38

- Sanae Fukuda, Naoyuki Shigyo, Koichi Kato, Shin Nakamura:
A ULSI 2-D capacitance simulator for complex structures based on actual processes.
39-47

- Taoyun Wang, Joseph R. Mautz, Roger F. Harrington:
The excess capacitance of a microstrip via in a dielectric substrate.
48-56

- Adam D. Sherer, Bob S. Stanojevich, Robert J. Bowman:
SMALS: a novel database for two-dimensional object location.
57-65

- David Marple, Michiel Smulders, Henk Hegen:
Tailor: a layout system based on trapezoidal corner stitching.
66-90

- Youssef Saab, Vasant B. Rao:
Fast effective heuristics for the graph bisectioning problem.
91-98

- Karem A. Sakallah, Yao-Tsung Yen, Steve S. Greenberg:
A first-order charge conserving MOS capacitance model.
99-108

Volume 9, Number 2, February 1990
- Han Young Koh, Carlo H. Séquin, Paul R. Gray:
OPASYN: a compiler for CMOS operational amplifiers.
113-125

- Don Stark, Mark Horowitz:
Techniques for calculating currents and voltages in VLSI power supply networks.
126-132

- Genhong Ruan, Jiri Vlach, James A. Barby:
Logic simulation with current-limited switches.
133-141

- Gregory T. Brauns, R. J. Bishop, Michael Steer, John J. Paulos, Sasan H. Ardalan:
Table-based modeling of delta-sigma modulators using ZSIM.
142-150

- Youn-Long Lin, Yu-Chin Hsu, Fur-Shing Tsai:
Hybrid routing.
151-157

- Kurt Mehlhorn, Stefan Näher:
A faster compaction algorithm with automatic jog insertion.
158-166

- Hyunchul Shin, Alberto L. Sangiovanni-Vincentelli, Carlo H. Séquin:
'Zone-refining' techniques for IC layout compaction.
167-179

- Michael Kaufmann:
A linear-time algorithm for routing in a convex grid.
180-184

- Jan-Ming Ho, Gopalakrishnan Vijayan, Chak-Kuen Wong:
New algorithms for the rectilinear Steiner tree problem.
185-193

- Ronald F. Ayres:
Completely automatic completion of VLSI designs.
194-202

- Sunggu Lee, Kang G. Shin:
Design for test using partial parallel scan.
203-211

- Fadi Maamari, Janusz Rajski:
A method of fault simulation based on stem regions.
212-220

Volume 9, Number 3, March 1990
- Makiko Okumura, Tsutomu Sugawara, Hiroshi Tanimoto:
An efficient small signal frequency analysis method of nonlinear circuits with two frequency excitations.
225-235

- Bernhard Hoppe, Gerd Neuendorf, Doris Schmitt-Landsiedel, J. Will Specks:
Optimization of high-speed CMOS logic circuits with analytical models for signal delay, chip area, and dynamic power dissipation.
236-247

- Wim De Pauw, Ludo Weyten:
Multiple storage adaptive multi-trees.
248-252

- Jonathan Rose, Wolfgang Klebsch, Jürgen Wolf:
Temperature measurement and equilibrium dynamics of simulated annealing placements.
253-259

- John Valainis, Sinan Kaptanoglu, Erwin Liu, Roberto Suaya:
Two-dimensional IC layout compaction based on topological design rule checking.
260-275

- Razali Ismail, Gehan Amaratunga:
Adaptive meshing schemes for simulating dopant diffusion.
276-289

- W. Scott Stornetta, Bernardo A. Huberman, Tad Hogg:
Scaling theory for fault stealing algorithms in large systolic arrays.
290-298

- Vijay S. Iyengar, Barry K. Rosen, John A. Waicukauski:
On computing the sizes of detected delay faults.
299-312

- Srinivas Patil, Prithviraj Banerjee:
A parallel branch and bound algorithm for test generation.
313-322

- Wei-Kang Huang, Yinan N. Shen, Fabrizio Lombardi:
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement.
323-328

- Sreejit Chakravarty, S. S. Ravi:
Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits.
329-331

- Niraj K. Jha:
Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuits.
332-336

Volume 9, Number 4, April 1990
- Daniel Weise:
Multilevel verification of MOS circuits.
341-351

- Lawrence T. Pillage, Ronald A. Rohrer:
Asymptotic waveform evaluation for timing analysis.
352-366

- An-Chang Deng, Yan-Chyuan Shiau:
Generic linear RC delay modeling for digital CMOS circuits.
367-376

- San-Yuan Wu, Sartaj Sahni:
Covering rectilinear polygons by rectangles.
377-388

- Kurt Mehlhorn, Wolfgang Rülling:
Compaction on the torus [VLSI layout].
389-397

- James P. Cohoon, Dana S. Richards, Jeffrey S. Salowe:
An optimal Steiner tree algorithm for a net whose terminals lie on the perimeter of a rectangle.
398-407

- Jason Cong, C. L. Liu:
Over-the-cell channel routing.
408-418

- Jan-Ming Ho, Majid Sarrafzadeh, Gopalakrishnan Vijayan, Chak-Kuen Wong:
Pad minimization for planar routing of multiple power nets.
419-426

- K. Iwasaki, F. Arakawa:
An analysis of the aliasing probability of multiple-input signature registers in the case of a 2m-ary symmetric channel.
427-438

- Farid N. Najm, Richard Burch, Ping Yang, Ibrahim N. Hajj:
Probabilistic simulation for reliability analysis of CMOS VLSI circuits.
439-450

Volume 9, Number 5, May 1990
- Christos A. Papachristou, Anil L. Pandya:
A design scheme for PLA-based control tables with reduced area and time-delay cost.
453-472

- Philip A. Wilsey, Subrata Dasgupta:
A formal model of computer architectures for digital system design environments.
473-486

- Kiyotaka Yamamura, Kazuo Horiuchi:
A globally and quadratically convergent algorithm for solving nonlinear resistive networks.
487-499

- Khushro Shahookar, Pinaki Mazumder:
A genetic approach to standard cell placement using meta-genetic parameter optimization.
500-511

- Wing Ning Li, Sartaj Sahni:
Pull up transistor folding.
512-521

- Pei-Yung Hsiao, Wu-Shiung Feng:
Using a multiple storage quad tree on a hierarchical VLSI compaction scheme.
522-536

- Paul Molitor:
Constrained via minimization for systolic arrays.
537-542

- Ernst Rank, Ulrich Weinert:
A simulation system for diffusive oxidation of silicon: a two-dimensional finite element approach.
543-550

- Anthony E. Parker, David J. Skellern:
An improved FET model for computer simulators.
551-553

- Navneet K. Jain, V. C. Prasad, A. B. Bhattacharyya:
Delay time sensitivity in nonlinear monotone RC trees.
554-560

Volume 9, Number 6, June 1990
- Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff:
Testability analysis of analog systems.
573-583

- Hans-Joachim Wunderlich:
Multiple distributions for biased random test patterns.
584-593

- Rob Dekker, Frans P. M. Beenker, Loek Thijssen:
A realistic fault model and test algorithms for static random access memories.
567-572

- Brian T. Murray, John P. Hayes:
Hierarchical test generation using precomputed tests for modules.
594-603

- Srinivas Devadas, Hi-Keung Tony Ma:
Easily testable PLA-based finite state machines.
604-611

- Bulent I. Dervisoglu:
Application of scan hardware and software for debug and diagnostics in a workstation environment.
612-620

- Stephen R. Demba, Ernst G. Ulrich, Karen Panetta Lentz, David Giramma:
Experiences with concurrent fault simulation of diagnostic programs.
621-628

- Kent D. Wilken, John Paul Shen:
Continuous signature monitoring: low-cost concurrent detection of processor control errors.
629-641

- S. Chowdhury, J. S. Barkatullah:
Estimation of maximum currents in MOS IC logic circuits.
642-654

- Duncan M. Hank Walker, D. S. Nydick:
DVLASIC: catastrophic fault yield simulation in a distributed processing environment.
655-664

- D. Y. Cheng, J. T. Deutsch, Robert W. Dutton:
'Defensive programming' in the rapid development of a parallel scientific program.
665-669

- Joel W. Gannett:
SHORTFINDER: a graphical CAD tool for locating net-to-net shorts in VLSI chip layouts.
669-674

Volume 9, Number 7, July 1990
- W. T. Liou, Jimmy J. M. Tan, Richard C. T. Lee:
Minimum rectangular partition problem for simple rectilinear polygons.
720-733

- Michael D. Osterman, Michael G. Pecht:
Placement for reliability and routability of convectively cooled PWBs.
734-744

- Chi-Yi Hwang, Yung-Chin Hsieh, Youn-Long Lin, Yu-Chin Hsu:
A fast transistor-chaining algorithm for CMOS cell layout.
781-786

- Forrest Brewer, Daniel D. Gajski:
Chippe: a system for constraint driven behavioral synthesis.
681-695

- Prathima Agrawal, Scott H. Robinson, Thomas G. Szymanski:
Automatic modeling of switch-level networks using partial orders [MOS circuits].
696-707

- Robert L. Maziasz, John P. Hayes:
Layout optimization of static CMOS functional cells.
708-719

- Shintaro Ushio, Kenji Nishi, Shigeki Kuroda, Kazuhiko Kai, Jun Ueda:
A fast three-dimensional process simulator OPUS/3D with access to two-dimensional simulation results.
745-751

- Debashis Bhattacharya, John P. Hayes:
Designing for high-level test generation.
752-766

- Micaela Serra, Terry Slater, Jon C. Muzio, D. Michael Miller:
The analysis of one-dimensional linear cellular automata and their aliasing properties.
767-778

- Doron Drusinsky-Yoresh:
Symbolic cover minimization of fully I/O specified finite state machines.
779-781

- Nripendra N. Biswas:
On covering distant minterms by the camp algorithm.
786-789

Volume 9, Number 8, August 1990
- Shiu-Kai Chin, Edward P. Stabler:
Synthesis of arithmetic hardware using hardware metafunctions.
793-803

- Nam Ling, Magdy A. Bayoumi:
Systolic temporal arithmetic: a new formalism for specification and verification of systolic arrays.
804-820

- Matthias Passlack, Manfred Uhle, Horst Elschner:
Analysis of propagation delays in high-speed VLSI circuits using a distributed line model.
821-826

- Pierre Roussel-Ragot, Gérard Dreyfus:
A problem independent parallel implementation of simulated annealing: models and experiments.
827-835

- Yu Hen Hu, Sao-Jie Chen:
GM Plan: a gate matrix layout algorithm based on artificial intelligence planning techniques.
836-845

- C. D. Maldonado, R. A. Williams:
A transient analytical model for predicting the redistribution of injected interstitials.
846-855

- Martin Thurner, Siegfried Selberherr:
Three-dimensional effects due to the field oxide in MOS devices analyzed with MINIMOS 5.
856-867

- Nagisa Ishiura, Masayuki Ito, Shuzo Yajima:
Dynamic two-dimensional parallel simulation technique for high-speed fault simulation on a vector processor.
868-875

- Michael Demjanenko, Shambhu J. Upadhyaya:
Yield enhancement of field programmable logic arrays by inherent component redundancy.
876-884

- Hideo Fujiwara, Tomoo Inoue:
Optimal granularity of test generation in a distributed system.
885-892

- Weiwei Mao, Michael D. Ciletti:
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation.
893-898

- Pak K. Chan, Kevin Karplus:
Computing signal delay in general RC networks by tree/link partitioning.
898-902

Volume 9, Number 9, September 1990
- Tiziano Villa, Alberto L. Sangiovanni-Vincentelli:
NOVA: state assignment of finite state machines for optimal two-level logic implementation.
905-924

- Gert Goossens, Jan M. Rabaey, Joos Vandewalle, Hugo De Man:
An efficient microcode compiler for application specific DSP processors.
925-937

- Michael C. McFarland, Thaddeus J. Kowalski:
Incorporating bottom-up design into hardware synthesis.
938-950

- Resve A. Saleh, Jacob K. White:
Accelerating relaxation algorithms for circuit simulation using waveform-Newton and step-size refinement.
951-958

- Bill Lin, A. Richard Newton:
A circuit disassembly technique for synthesizing symbolic layouts from mask descriptions.
959-969

- Matthias F. M. Stallmann, Thomas A. Hughes, Wentai Liu:
Unconstrained via minimization for topological multilayer routing.
970-980

- Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal:
Toward massively parallel automatic test generation.
981-994

- Farid N. Najm, Ibrahim N. Hajj:
The complexity of fault detection in MOS VLSI circuits.
995-1001

- Chung-Yu Wu, Ming-Chuen Shiau:
Efficient physical timing models for CMOS AND-OR-inverter and OR-AND-inverter gates and their applications.
1002-1009

- F. Joel Ferguson:
Detection of multiple faults in MOS circuits.
1009-1014

Volume 9, Number 10, October 1990
- TingTing Hwang, Robert Michael Owens, Mary Jane Irwin:
Exploiting communication complexity for multilevel logic synthesis.
1017-1027

- Asim J. Al-Khalili, Yong Zhu, Dhamin Al-Khalili:
A module generator for optimized CMOS buffers.
1028-1046

- Evangelos Simoudis:
Learning redesign knowledge circuit redesign.
1047-1062

- Patrick Odent, Luc J. M. Claesen, Hugo De Man:
Acceleration of relaxation-based circuit simulation using a multiprocessor system.
1063-1072

- Jonathan Rose:
Parallel global routing for standard cells.
1085-1095

- Raja Venkateswaran, Pinaki Mazumder:
A hexagonal array machine for multilayer wire routing.
1096-1112

- E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan:
A new approach to the simulation of the coupled point defects and impurity diffusion.
1113-1122

- Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee:
A universal MOSFET mobility degradation model for circuit simulation.
1123-1126

- Jacques Benkoski, E. Vanden Meersch, Luc J. M. Claesen, Hugo De Man:
Timing verification using statically sensitizable paths.
10723-10784

Volume 9, Number 11, November 1990
- D. Schroeder:
Three-dimensional nonequilibrium interface conditions for electron transport at band edge discontinuities.
1136-1140

- Gerhard K. M. Wachutka:
Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling.
1141-1149

- Tarek Shawki, Georges Salmer, Osman El-Sayed:
2-D simulation of degenerate hot electron transport in MODFETs including DX center trapping.
1150-1163

- Paolo Lugli:
The Monte Carlo method for semiconductor device and process modeling.
1164-1176

- Kenji Taniguchi, Yoshiaki Shibata, Chihiro Hamaguchi:
Process modeling and simulation: boundary conditions for point defect-based impurity diffusion model.
1177-1183

- Wolfgang Bergner, Roland Kircher:
SITAR-an efficient 3-D simulator for optimization of nonplanar trench structures.
1184-1188

- Martin Thurner, Philipp Lindorfer, Siegfried Selberherr:
Numerical treatment of nonrectangular field-oxide for 3-D MOSFET simulation.
1189-1197

- Arokia Nathan, Henry Baltes, Walter Allegretto:
Review of physical models for numerical simulation of semiconductor microsensors.
1198-1208

- Peter Lloyd, Heinz K. Dirks, E. James Prendergast, Kishore Singhal:
Technology CAD for competitive products.
1209-1216

- Chiaki Takano, Zhiping Yu, Robert W. Dutton:
A nonequilibrium one-dimensional quantum-mechanical simulation for AlGaAs/GaAs HEMT structures.
1217-1224

- Valery Axelrad:
Fourier method modeling of semiconductor devices.
1225-1237

- Yue-Sun Kuo:
Representing large cell maps.
1238-1241

Volume 9, Number 12, December 1990
- Wing Ning Li, Sudhakar M. Reddy, Sartaj Sahni:
Long and short covering edges in combination logic circuits.
1245-1253

- Angelo Brambilla, Enrico Dallago:
A circuit-level simulation model of PNPN devices.
1254-1264

- Jih-Shyr Yih, Pinaki Mazumder:
A neural network design for circuit partitioning.
1265-1271

- Jan-Ming Ho, Majid Sarrafzadeh, Gopalakrishnan Vijayan, Chak-Kuen Wong:
Layer assignment for multichip modules.
1272-1277

- Patrick Groeneveld:
A multiple layer contour-based gridless channel router.
1278-1288

- Godfried M. Swinkels, Louis J. Hafer:
Schematic generation with an expert system.
1289-1306

- Pierre-François Dubois, Alain Puissochet, Anne-Marie Tagant:
A general and flexible switchbox router: CARIOCA.
1307-1317

- Charles Chiang, Majid Sarrafzadeh, Chak-Kuen Wong:
Global routing based on Steiner min-max trees.
1318-1325

- Gopalakrishnan Vijayan:
Partitioning logic on graph structures to minimize routing cost.
1326-1334

- Gabriel M. Silberman, Ilan Y. Spillinger:
Using functional fault simulation and the difference fault model to estimate implementation fault coverage.
1335-1343

- Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers.
1344-1353

- Richard Booth, Marvin White:
Simulation of a MOS transistor with spatially nonuniform channel parameters.
1354-1357

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