IEEE Transactions on Reliability, Volume 52

Volume 52, Number 1, March 2003

• R. A. Evans:
  Editorial reasonable engineering guess. 1
  
• R. A. Evans:
  Editorial genuine imitation Bayesian. 2
  
• R. A. Evans:
  Editorial confidence intervals for discrete variables. 3
  
• Xu Haiyan, Tang Yincai:
  Commentary: the Khamis/Higgins model. 4-6
  
• R. A. Betensky, E. C. Martin:
  Commentary: failure-rate functions for doubly-truncated random variables. 7-8
  
• A. Birolini:
  Commentary: author reply to a book review. 9
  
• J. A. Connor:
  Commentary: getting real about reliability, through wit and humor. 10-13
  
• Shaomin Wu, Ling-Yau Chan:
  Performance utility-analysis of multi-state systems. 14-21
  
• Li Sheng, Jie Wu:
  Maximum-shortest-path (MSP) is not optimal for a general N×N torus. 22-25
  
• S. Gasmi, C. E. Love, W. Kahle:
  A general repair, proportional-hazards, framework to model complex repairable systems. 26-32
  
• C. D. Lai, Min Xie, D. N. P. Murthy:
  A modified Weibull distribution. 33-37
  
• Jie Mi:
  A unified way of comparing the reliability of coherent systems. 38-43
  
• M. Lanus, Liang Yin, Kishor S. Trivedi:
  Hierarchical composition and aggregation of state-based availability and performability models. 44-52
  
• C. Constantinescu:
  Experimental evaluation of error-detection mechanisms. 53-57
  
• M. G. F. Bell:
  The use of game theory to measure the vulnerability of stochastic networks. 63-68
  
• O. Gaudoin, Bo Yang, Min Xie:
  A simple goodness-of-fit test for the power-law process, based on the Duane plot. 69-74
  
• Nong Ye, Sean Vilbert, Qiang Chen:
  Computer intrusion detection through EWMA for autocorrelated and uncorrelated data. 75-82
  
• Yeh Lam, Yuan Lin Zhang:
  A geometric-process maintenance model for a deteriorating system under a random environment. 83-89
  
• N. Balakrishnan, N. Kannan, C.-T. Lin, H. K. T. Ng:
  Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples. 90-95
  
• Antoine Rauzy:
  A new methodology to handle Boolean models with loops. 96-105
  
• A. O. C. Elegbede, Chengbin Chu, Kondo H. Adjallah, Farouk Yalaoui:
  Reliability allocation through cost minimization. 106-111
  
• A. Brezavscek, A. Hudoklin:
  Joint optimization of block-replacement and periodic-review spare-provisioning policy. 112-117
  
• T. R. Bennett, J. M. Booker, Sallie Keller-McNulty, Nozer D. Singpurwalla:
  Testing the untestable: reliability in the 21st century. 118-124
  
• G.-A. Klutke, Peter C. Kiessler, M. A. Wortman:
  A critical look at the bathtub curve. 125-129
  
• T. E. Salzer:
  Tubulation techniques for locating fine-leak sites in hermetic electronic packages. 130-132
  
• Nader B. Ebrahimi:
  Indirect assessment of system reliability. 58-62
  

Volume 52, Number 2, June 2003

• Hoang Pham:
  Commentary: steady-state series-system availability. 146-147
  
• J. A. McLinn:
  Commentary: material review board in 2003. 148
  
• W. Tustin:
  Commentary: real education. 149
  
• A.-R. M. Abouammoh, I. S. Qamber:
  New better than renewal-used classes of life distributions. 150-153
  
• M. L. Ulrey:
  Formulas for the distribution of sums of independent exponential random variables. 154-161
  
• A. J. Fry:
  Integrity-based self-validation test scheduling. 162-167
  
• Philip J. Boland, Harshinder Singh:
  A birth-process approach to Moranda's geometric software-reliability model. 168-174
  
• Antoine Rauzy:
  Toward an efficient implementation of the MOCUS algorithm. 175-180
  
• Ruiqing Zhao, Baoding Liu:
  Stochastic programming models for general redundancy-optimization problems. 181-191
  
• Gregory Levitin:
  Optimal allocation of multistate elements in a linear consecutively-connected system. 192-199
  
• A. M. Mathai:
  Order statistics from a logistic distribution and applications to survival and reliability analysis. 200-206
  
• Héctor Cancela, Mohamed El Khadiri:
  The recursive variance-reduction simulation algorithm for network reliability evaluation. 207-212
  
• J. D. Andrews, S. Beeson:
  Birnbaum's measure of component importance for noncoherent systems. 213-219
  
• Yong Ou, Joanne Bechta Dugan:
  Approximate sensitivity analysis for acyclic Markov reliability models. 220-230
  
• Gregory Levitin:
  Reliability evaluation for acyclic transmission networks of multi-state elements with delays. 231-237
  
• Hairong Sun, James J. Han, Haim Levendel:
  Availability requirement for a fault-management server in high-availability communication systems. 238-244
  
• Dong Xiang, Ai Chen, Jie Wu:
  Reliable broadcasting in wormhole-routed hypercube-connected networks using local safety information. 245-256
  
• J. Quigley, Lesley Walls:
  Confidence intervals for reliability-growth models with small sample-sizes. 257-262
  
• Gregory Levitin:
  Linear multi-state sliding-window systems. 263-269
  

Volume 52, Number 3, September 2003

• R. A. Evans:
  Editorials-from 1978. 273-276
  
• R. A. Evans:
  Editorials-from 1979. 277-280
  
• R. A. Evans:
  Editorials-from 1980. 281-284
  
• R. A. Evans:
  Editorials-from 1981. 285-288
  
• Alexandru O. Balan, Lorenzo Traldi:
  Preprocessing minpaths for sum of disjoint products. 289-295
  
• Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
  Extending integrated-circuit yield-models to estimate early-life reliability. 296-300
  
• S. Beeson, J. D. Andrews:
  Importance measures for noncoherent-system analysis. 301-310
  
• A. Biswas, J. Sarkar, S. Sarkar:
  Availability of a periodically inspected system, maintained under an imperfect-repair policy. 311-318
  
• Juan A. Carrasco:
  Solving dependability/performability irreducible Markov models using regenerative randomization. 319-329
  
• Joohan Lee, Steve J. Chapin, S. Taylor:
  Reliable heterogeneous applications. 330-339
  
• Gregory Levitin:
  Reliability of multi-state systems with two failure-modes. 340-348
  
• Anna Richelli, Luigi Colalongo, Zsolt Miklós Kovács-Vajna:
  Increasing the immunity to electromagnetic interferences of CMOS OpAmps. 349-353
  
• Shiuh-Pyng Shieh, Yea-Ching Tsai, Yu-Lun Huang:
  Optimal information-dispersal for fault-tolerant communication over a burst-error channel. 354-366
  
• G. Shmueli:
  Computing consecutive-type reliabilities nonrecursively. 367-372
  
• S. K. Yang:
  A condition-based failure-prediction and processing-scheme for preventive maintenance. 373-383
  

Volume 52, Number 4, December 2003

• Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu:
  Built-in redundancy analysis for memory yield improvement. 386-399
  
• Fabrizio Ferrandi, Franco Fummi, Graziano Pravadelli, Donatella Sciuto:
  Identification of design errors through functional testing. 400-412
  
• Karl Thaller, Andreas Steininger:
  A transparent online memory test for simultaneous detection of functional faults and soft errors in memories. 413-422
  
• Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park:
  Maximal diagnosis of interconnects of random access memories. 423-434
  
• J. H. Jiang, Wen-Ben Jone, Shih-Chieh Chang, S. Ghosh:
  Embedded core test generation using broadcast test architecture and netlist scrambling. 435-443
  
• W. P. M. Allen, D. G. Bailey, Serge N. Demidenko, Vincenzo Piuri:
  Analysis and application of digital spectral warping in analog and mixed-signal testing. 444-457
  
• Cristiana Bolchini:
  A software methodology for detecting hardware faults in VLIW data paths. 458-468
  
• Cecilia Metra, Luca Schiano, Michele Favalli:
  Concurrent detection of power supply noise. 469-475
  
• Gian-Carlo Cardarilli, A. Leandri, P. Marinucci, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
  Design of a fault tolerant solid state mass memory. 476-491
  
• Stanislaw J. Piestrak, Abbas Dandache, Fabrice Monteiro:
  Designing fault-secure parallel encoders for systematic linear error correcting codes. 492-500
  
• Kaijie Wu, Ramesh Karri:
  Selectively breaking data dependences to improve the utilization of idle cycles in algorithm level re-computing data paths. 501-511
  
• Christoph Scherrer, Andreas Steininger:
  Dealing with dormant faults in an embedded fault-tolerant computer system. 512-522
  
• A. Barros, C. Bérenguer, A. Grall:
  Optimization of replacement times using imperfect monitoring information. 523-533