IEEE Transactions on Reliability, Volume 54

Volume 54, Number 1, March 2005

• Suprasad V. Amari:
  Comment on: a hazard function approximation used in reliability theory. 2
  
• Zehua Chen, Shurong Zheng:
  Lifetime distribution based degradation analysis. 3-10
  
• H. Hirose:
  The trunsored model and its applications to lifetime analysis: unified censored and truncated models. 11-21
  
• Sangun Park:
  Testing exponentiality based on the Kullback-Leibler information with the type II censored data. 22-26
  
• N. Balakrishnan, C.-T. Lin, Ping-Shing Chan:
  A comparison of two simple prediction intervals for exponential distribution. 27-33
  
• A. A. Soliman:
  Estimation of parameters of life from progressively censored data using Burr-XII model. 34-42
  
• Francis G. Pascual, Grace Montepiedra:
  Lognormal and Weibull accelerated life test plans under distribution misspecification. 43-52
  
• Guangbin Yang:
  Accelerated life tests at higher usage rates. 53-57
  
• Loon Ching Tang, Kai Xu:
  A multiple objective framework for planning accelerated life tests. 58-63
  
• A. A. Alhadeed, Shie-Shien Yang:
  Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. 64-68
  
• Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis:
  A concurrent built-in self-test architecture based on a self-testing RAM. 69-78
  
• Y. Saito, T. Hashinaga, S. Nakajima:
  Effect of CVD-SiO₂ film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. 79-82
  
• Zhimin He, Han Tong Loh, Eng Hong Ong:
  A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators. 83-91
  
• Ruey Huei Yeh, Gaung-Cheng Chen, Ming-Yuh Chen:
  Optimal age-replacement policy for nonrepairable products under renewing free-replacement warranty. 92-97
  
• Winfrid G. Schneeweiss:
  Toward a deeper understanding of the availability of series-systems without aging during repairs. 98-99
  
• Yuan-Shun Dai, Min Xie, Kim-Leng Poh:
  Modeling and analysis of correlated software failures of multiple types. 100-106
  
• Daniel R. Jeske, Xuemei Zhang, Loan Pham:
  Adjusting software failure rates that are estimated from test data. 107-114
  
• Ing-Ray Chen, Baoshan Gu, Sapna E. George, Sheng-Tzong Cheng:
  On failure recoverability of client-server applications in mobile wireless environments. 115-122
  
• Kyu-Seek Sohn, Seung Yeob Nam, Dan Keun Sung:
  A spare bandwidth sharing scheme based on network reliability. 123-132
  
• Sieteng Soh, Suresh Rai:
  An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacities. 133-144
  
• Hosam M. F. AboElFotoh, S. S. Iyengar, K. Chakrabarty:
  Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failures. 145-155
  
• Antoine Rauzy:
  A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components. 156-158
  
• Jian-Ping Li, G. Thompson:
  A method to take account of inhomogeneity in mechanical component reliability calculations. 159-168
  
• F. K. Hwang:
  A hierarchy of importance indices. 169-172
  
• K. Jenab, B. S. Dhillon:
  Stochastic fault tree analysis with self-loop basic events. 173-180
  
• M. V. Frank:
  View through the door of the SOFIA project. 181-188
  

Volume 54, Number 2, June 2005

• W. B. Nelson:
  A bibliography of accelerated test plans. 194-197
  
• Ji Hwan Cha:
  On optimal burn-in procedures - a generalized model. 198-206
  
• K. O. Kim, W. Kuo:
  Some considerations on system burn-in. 207-214
  
• Ozgur Sinanoglu, Alex Orailoglu:
  Test power reductions through computationally efficient, decoupled scan chain modifications. 215-223
  
• V. E. Johnson, A. Moosman, P. Cotter:
  A hierarchical model for estimating the early reliability of complex systems. 224-231
  
• Xinyu Chen, Michael R. Lyu:
  Reliability analysis for various communication schemes in wireless CORBA. 232-242
  
• Marzio Marseguerra, Enrico Zio, Luca Podofillini, David W. Coit:
  Optimal design of reliable network systems in presence of uncertainty. 243-253
  
• A. Yalaoui, E. Chatelet, Chengbin Chu:
  A new dynamic programming method for reliability & redundancy allocation in a parallel-series system. 254-261
  
• H. Gutierrez-Pulido, V. Aguirre-Torres, J. A. Christen:
  A practical method for obtaining prior distributions in reliability. 262-269
  
• E. T. Wondmagegnehu, J. Navarro, P. J. Hernandez:
  Bathtub shaped failure rates from mixtures: a practical point of view. 270-275
  
• P. Erto, B. Palumbo:
  Origins, properties, and parameters estimation of the hyperbolic reliability model. 276-281
  
• C. Park:
  Parameter estimation of incomplete data in competing risks using the EM algorithm. 282-290
  
• Liyang Xie, Jinyu Zhou, Xuemin Wang:
  Data mapping and the prediction of common cause failure probability. 291-296
  
• Wenjian Li, Hoang Pham:
  Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. 297-303
  
• C. Richard Cassady, E. Kutanoglu:
  Integrating preventive maintenance planning and production scheduling for a single machine. 304-309
  
• Wei Huang, D. L. Dietrich:
  An alternative degradation reliability modeling approach using maximum likelihood estimation. 310-317
  
• Wenjian Li, Hoang Pham:
  An inspection-maintenance model for systems with multiple competing processes. 318-327
  
• Yueqin Wu, Jiancheng Guan:
  Repairable consecutive-k-out-of-n: G systems with r repairmen. 328-337
  
• Shaomin Wu, D. Clements-Croome:
  Optimal maintenance policies under different operational schedules. 338-346
  
• Shey-Huei Sheu, Yuh-Bin Lin, Gwo-Liang Liao:
  Optimal policies with decreasing probability of imperfect maintenance. 347-357
  
• Hsing-Chung Liang, Wen-Chin Ho, Ming-Chieh Cheng:
  Identify unrepairability to speed-up spare allocation for repairing memories. 358-365
  
• N. Balakrishnan, C.-T. Lin, Ping-Shing Chan:
  Correction to "A Comparison of Two Simple Prediction Intervals for Exponential Distribution". 366
  

Volume 54, Number 3, September 2005

• W. B. Nelson:
  A bibliography of accelerated test plans part II - references. 370-373
  
• H. K. T. Ng:
  Parameter estimation for a modified Weibull distribution, for progressively type-II censored samples. 374-380
  
• Irad E. Ben-Gal:
  On the use of data compression measures to analyze robust designs. 381-388
  
• E. S. Ahmed, A. I. Volodin, A. A. Hussein:
  Robust weighted likelihood estimation of exponential parameters. 389-395
  
• I. A. Ahmad, M. Kayid, Xiaohu Li:
  The NBUT class of life distributions. 396-401
  
• Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min:
  Optimal, and reliable communication in hypercubes using extended safety vectors. 402-411
  
• Li Bai:
  Circular sequential k-out-of-n congestion system. 412-420
  
• Fang-Ming Shao, Xuemin Shen, Pin-Han Ho:
  Reliability optimization of distributed access networks with constrained total cost. 421-430
  
• Yong Chen, Qingyu Yang:
  Reliability of two-stage weighted-k-out-of-n systems with components in common. 431-440
  
• Viera Stopjaková, P. Malosek, M. Matej, Vladislav Nagy, Martin Margala:
  Defect detection in analog and mixed circuits by neural networks using wavelet analysis. 441-448
  
• Jie Wu, Zhen Jiang:
  On constructing the minimum orthogonal convex polygon for the fault-tolerant routing in 2-D faulty meshes. 449-458
  
• Anurag Tiwari, Karen A. Tomko:
  Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correction. 459-467
  
• C. Constantinescu:
  Dependability evaluation of a fault-tolerant processor by GSPN modeling. 468-474
  
• Yong Chen, Jionghua Jin:
  Quality-reliability chain modeling for system-reliability analysis of complex manufacturing processes. 475-488
  
• J. S. Ivy, S. M. Pollock:
  Marginally monotonic maintenance policies for a multi-state deteriorating machine with probabilistic monitoring, and silent failures. 489-497
  
• Todd A. DeLong, D. Todd Smith, Barry W. Johnson:
  Dependability metrics to assess safety-critical systems. 498-505
  
• Dazhi Wang, Kishor S. Trivedi:
  Computing steady-state mean time to failure for non-coherent repairable systems. 506-516
  
• Jose Emmanuel Ramirez-Marquez, David W. Coit:
  Composite importance measures for multi-state systems with multi-state components. 517-529
  
• C. Park, W. J. Padgett:
  New cumulative damage models for failure using stochastic processes as initial damage. 530-540
  
• Yujuan Bao, Xiaobai Sun, Kishor S. Trivedi:
  A workload-based analysis of software aging, and rejuvenation. 541-548
  
• M. Agarwal, R. Gupta:
  Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization. 549-558
  

Volume 54, Number 4, December 2005

• Saralees Nadarajah, Samuel Kotz:
  On some recent modifications of Weibull distribution. 561-562
  
• C. D. Lai, Min Xie, D. N. P. Murthy:
  Reply to "On Some Recent Modifications of Weibull Distribution". 563
  
• C. Richard Cassady, I. M. Iyoob, K. Schneider, Edward A. Pohl:
  A generic model of equipment availability under imperfect maintenance. 564-571
  
• L. Attardi, G. Pulcini:
  A new model for repairable systems with bounded failure intensity. 572-582
  
• Chin-Yu Huang, Michael R. Lyu:
  Optimal release time for software systems considering cost, testing-effort, and test efficiency. 583-591
  
• Chin-Yu Huang, Michael R. Lyu:
  Optimal testing resource allocation, and sensitivity analysis in software development. 592-603
  
• J. Quigley, Lesley Walls:
  Nonparametric bootstrapping of the reliability function for multiple copies of a repairable item modeled by a birth process. 604-611
  
• M. P. Kaminskiy, V. V. Krivtsov:
  A simple procedure for Bayesian estimation of the Weibull distribution. 612-616