IEEE Transactions on Reliability, Volume 56

Volume 56, Number 1, March 2007

• Jason W. Rupe:
  Editorial - IEEE Editors Survey on the Features of Accepted Papers. 2-9
  
• Yi-Kuei Lin:
  Reliability of a Flow Network Subject to Budget Constraints. 10-16
  
• Yi-Kuei Lin:
  System Reliability of a Limited-Flow Network in Multicommodity Case. 17-25
  
• M. Agarwal, K. Sen, P. Mohan:
  GERT Analysis of m-Consecutive-k-Out-of-n Systems. 26-34
  
• Serkan Eryilmaz:
  On the Lifetime Distribution of Consecutive -out-of-n: F System. 35-39
  
• H. R. Guo, Haitao Liao, Wenbiao Zhao, A. Mettas:
  A New Stochastic Model for Systems Under General Repairs. 40-49
  
• Kin-Ping Hui:
  Monte Carlo Network Reliability Ranking Estimation. 50-57
  
• Liudong Xing:
  Reliability Evaluation of Phased-Mission Systems With Imperfect Fault Coverage and Common-Cause Failures. 58-68
  
• Wei-Ting Kary Chien, S. F. Yang:
  A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. 69-76
  
• Chenhua Li, N. Fard:
  Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data. 77-84
  
• Francis G. Pascual:
  Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter. 85-93
  
• J. Onishi, S. Kimura, R. J. W. James, Y. Nakagawa:
  Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method. 94-101
  
• B. M. Golam Kibria, Saralees Nadarajah:
  Reliability Modeling: Linear Combination and Ratio of Exponential and Rayleigh. 102-105
  
• Furong Tan, Zhibin Jiang, Suk Joo Bae:
  Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems. 106-114
  
• N. Turkkan, T. Pham-Gia:
  System Stress-Strength Reliability: The Multivariate Case. 115-124
  
• J. Nierwinski:
  Reliability Sampling Methodology Using Simulation and Re-Sampling. 125-131
  
• Ammar M. Sarhan:
  Analysis of Incomplete, Censored Data in Competing Risks Models With Generalized Exponential Distributions. 132-138
  
• L.-R. Chang-Chien, Yin-Juin Lin, Chin-Chung Wu:
  A Real-Time Contingency Reserve Scheduling for an Isolated Power System. 139-147
  
• Gregory Levitin:
  Optimal Defense Strategy Against Intentional Attacks. 148-157
  
• M. Giorgio, M. Guida, G. Pulcini:
  A Wear Model for Assessing the Reliability of Cylinder Liners in Marine Diesel Engines. 158-166
  
• Jason W. Rupe:
  Review of Optimal Reliability Design, Fundamentals and Applications. 167
  
• Jason W. Rupe:
  Review of Reliability of Large Scale Systems. 167-168
  
• Way Kuo:
  Corrections to "Challenges Related to Reliability in Nano Electronics". 169
  

Volume 56, Number 2, June 2007

• Way Kuo:
  Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores. 178-181
  
• George R. Roelke, Rusty O. Baldwin, Barry E. Mullins, Yong C. Kim:
  A Cache Architecture for Extremely Unreliable Nanotechnologies. 182-197
  
• Chin-Yu Huang, Sy-Yen Kuo, Michael R. Lyu:
  An Assessment of Testing-Effort Dependent Software Reliability Growth Models. 198-211
  
• Taghi M. Khoshgoftaar, Kehan Gao:
  Count Models for Software Quality Estimation. 212-222
  
• Kehan Gao, Taghi M. Khoshgoftaar:
  A Comprehensive Empirical Study of Count Models for Software Fault Prediction. 223-236
  
• Taghi M. Khoshgoftaar, Yi Liu:
  A Multi-Objective Software Quality Classification Model Using Genetic Programming. 237-245
  
• Babu Zachariah, R. N. Rattihalli:
  Failure Size Proportional Models and an Analysis of Failure Detection Abilities of Software Testing Strategies. 246-253
  
• Changcheng Huang, Minzhe Li, Anand Srinivasan:
  A Scalable Path Protection Mechanism for Guaranteed Network Reliability Under Multiple Failures. 254-267
  
• Li Bai:
  Generalized Access Structure Congestion System. 268-274
  
• Dirk P. Kroese, Kin-Ping Hui, Sho Nariai:
  Network Reliability Optimization via the Cross-Entropy Method. 275-287
  
• Sy-Yen Kuo, Fu-Min Yeh, Hung-Yau Lin:
  Efficient and Exact Reliability Evaluation for Networks With Imperfect Vertices. 288-300
  
• Narayanaswamy Balakrishnan, Arezou Habibi Rad, Naser Reza Arghami:
  Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data. 301-307
  
• Theodora Dimitrakopoulou, Konstantinos Adamidis, Sotirios Loukas:
  A Lifetime Distribution With an Upside-Down Bathtub-Shaped Hazard Function. 308-311
  
• Ammar M. Sarhan, Frank M. Guess, John S. Usher:
  Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data. 312-320
  
• Yefim H. Michlin, Genady Grabarnik:
  Sequential Testing for Comparison of the Mean Time Between Failures for Two Systems. 321-331
  
• Ali Haj Shirmohammadi, Zhe George Zhang, Ernie Love:
  A Computational Model for Determining the Optimal Preventive Maintenance Policy With Random Breakdowns and Imperfect Repairs. 332-339
  
• Zehui Li, Peng Zhao:
  Reliability Analysis on the delta-Shock Model of Complex Systems. 340-348
  
• M. J. LuValle:
  Identifying Mechanisms That Highly Accelerated Tests Miss. 349-359
  
• Juan A. Carrasco:
  Corrections on "Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems" [Jun 06 207-236]. 360
  
• M. P. Kaminskiy, V. V. Krivtsov, Saralees Nadarajah:
  Erratum [Dec 05 612-616]. 360
  

Volume 56, Number 3, September 2007

• Way Kuo, Jason W. Rupe:
  R-Impact: Reliability-Based Citation Impact Factor. 366-367
  
• Min-Hsiung Hsieh, Shuen-Lin Jeng:
  Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. 369-380
  
• Chong Zhao, Xiaoliang Bai, Sujit Dey:
  Evaluating Transient Error Effects in Digital Nanometer Circuits. 381-391
  
• Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
  Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. 392-400
  
• Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang:
  A Review of Reliability Research on Nanotechnology. 401-410
  
• Wen-Li Wang, Thomas L. Hemminger, Mei-Huei Tang:
  A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures. 411-421
  
• Eduardo Oliveira Costa, Gustavo A. de Souza, Aurora Trinidad Ramirez Pozo, Silvia Regina Vergilio:
  Exploring Genetic Programming and Boosting Techniques to Model Software Reliability. 422-434
  
• Lixuan Lu, Jin Jiang:
  Joint Failure Importance for Noncoherent Fault Trees. 435-443
  
• Yuan-Shun Dai, Gregory Levitin:
  Optimal Resource Allocation for Maximizing Performance and Reliability in Tree-Structured Grid Services. 444-453
  
• Hoang Pham, Chin-Diew Lai:
  On Recent Generalizations of the Weibull Distribution. 454-458
  
• William J. Owen:
  An Exponential Damage Model for Strength of Fibrous Composite Materials. 459-463
  
• Albert F. Myers:
  k-out-of-n: G System Reliability With Imperfect Fault Coverage. 464-473
  
• Jose Emmanuel Ramirez-Marquez, Bethel A. Gebre:
  A Classification Tree Based Approach for the Development of Minimal Cut and Path Vectors of a Capacitated Network. 474-487
  
• Wei-Chang Yen:
  A Simple Heuristic Algorithm for Generating All Minimal Paths. 488-494
  
• Li Bai, Fan Zheng:
  Ternary State Circular Sequential k-out-of-n Congestion System. 495-505
  
• Gary Hardy, Corinne Lucet, Nikolaos Limnios:
  K-Terminal Network Reliability Measures With Binary Decision Diagrams. 506-515
  
• Xian Zhao, Lirong Cui, Way Kuo:
  Reliability for Sparsely Connected Consecutive-k Systems. 516-524
  
• Gerard L. Reijns, Arjan J. C. van Gemund:
  Reliability Analysis of Hierarchical Systems Using Statistical Moments. 525-533
  
• Bhupender Parashar, Gulshan Taneja:
  Reliability and Profit Evaluation of a PLC Hot Standby System Based on a Master-Slave Concept and Two Types of Repair Facilities. 534-539
  
• Dazhi Wang, Kishor S. Trivedi:
  Reliability Analysis of Phased-Mission System With Independent Component Repairs. 540-551
  
• Shaomin Wu, Min Xie:
  Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. 552-561
  
• Tsong Yueh Chen, Robert G. Merkel:
  Quasi-Random Testing. 562-568
  
• Hai-Yan Xu, He-Liang Fei:
  Planning Step-Stress Accelerated Life Tests With Two Experimental Variables. 569-579
  

Volume 56, Number 4, December 2007

• Way Kuo:
  Compatibility and Simplicity: The Fundamentals of Reliability. 585-586
  
• Jérôme Collet:
  Correction to "Some Remarks on Rare-Event Approximation". 587
  
• Ming-Wei Wu, Yi-Min Wang, Sy-Yen Kuo, Yennun Huang:
  Self-Healing Spyware: Detection, and Remediation. 588-596
  
• Long Wang, Zbigniew Kalbarczyk, Weining Gu, Ravishankar K. Iyer:
  Reliability MicroKernel: Providing Application-Aware Reliability in the OS. 597-614
  
• Günther A. Hoffmann, Kishor S. Trivedi, Miroslaw Malek:
  A Best Practice Guide to Resource Forecasting for Computing Systems. 615-628
  
• Y. P. Wu, Q. P. Hu, M. Xie, S. H. Ng:
  Modeling and Analysis of Software Fault Detection and Correction Process by Considering Time Dependency. 629-642
  
• W. Douglas Obal II, Michael G. McQuinn, William H. Sanders:
  Detecting and Exploiting Symmetry in Discrete-State Markov Models. 643-654