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 | 2012 | |
|---|---|---|
| c9 |      | Takahiro J. Yamaguchi, Kunihiro Asada, Kiichi Niitsu, Mohamed Abbas, Satoshi Komatsu, Haruo Kobayashi, Jose A. Moreira: A New Procedure for Measuring High-Accuracy Probability Density Functions. Asian Test Symposium 2012: 185-190 |
| 2011 | ||
| c8 | | Mohamed Abbas, Takahiro J. Yamaguchi, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada: Novel technique for minimizing the comparator delay dispersion in 65nm CMOS technology. ICECS 2011: 220-223 |
| c7 | | Takahiro J. Yamaguchi, Mohamed Abbas, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Satoshi Komatsu, Kunihiro Asada: An equivalent-time and clocked approach for continuous-time quantization. ISCAS 2011: 2529-2532 |
| c6 | | Takahiro J. Yamaguchi, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Kunihiro Asada, Mohamed Abbas, Satoshi Komatsu: Application of a continuous-time level crossing quantization method for timing noise measurements. ITC 2011: 1-10 |
| 2010 | ||
| c5 | | Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada: An automatic test generation framework for digitally-assisted adaptive equalizers in high-speed serial links. DATE 2010: 1755-1760 |
| 2009 | ||
| c4 | | Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada: Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links. European Test Symposium 2009: 107-112 |
| 2006 | ||
| j2 | | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada: On-Chip Detector for Single-Event Noise Sensing with Voltage Scaling Function. IEICE Transactions 89-C(3): 370-376 (2006) |
| j1 | | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada: Noise Immunity Investigation of Low Power Design Schemes. IEICE Transactions 89-C(8): 1238-1247 (2006) |
| c3 | | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada: On-chip 8GHz non-periodic high-swing noise detector. DATE 2006: 670-671 |
| c2 |  | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada: Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow. DDECS 2006: 147-148 |
| 2004 | ||
| c1 | | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada: Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime. DFT 2004: 87-95 |
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