Sami A. Al-Arian

List of publications from the DBLP Bibliography Server - FAQ
Other views: by type - by year (modern) - classic-C

Ask others: ACM DL/Guide -

- CSB - MetaPress - Google - Bing - Yahoo

	2000
j3		Bassam Shaer, Sami A. Al-Arian, David L. Landis: Partitioning sequential circuits for pseudoexhaustive testing. IEEE Trans. VLSI Syst. 8(5): 534-541 (2000)
j2		Bassam Shaer, David L. Landis, Sami A. Al-Arian: Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. IEEE Trans. VLSI Syst. 8(6): 750-754 (2000)
	1999
c13		Bassam Shaer, Sami A. Al-Arian, David L. Landis: Pseudo-Exhaustive Testing of Sequential Circuits. Great Lakes Symposium on VLSI 1999: 109-
	1998
c12		Bassam Shaer, Sami A. Al-Arian, David L. Landis: Partitioning algorithm to enhance VLSI testability. ACM Southeast Regional Conference 1998: 121-129
	1997
c11		Musaed A. Al-Kharji, Sami A. Al-Arian: A New Heuristic Algorithm for Estimating Signal and Detection Probabilities. Great Lakes Symposium on VLSI 1997: 26-31
	1996
c10		Stephan P. Athan, David L. Landis, Sami A. Al-Arian: A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs. VTS 1996: 118-123
	1994
c9		Randy E. Bolling, Sami A. Al-Arian: Reconfigurable Linear Feedback Register Design, Analysis & Applications. ISCAS 1994: 87-90
c8		Sami A. Al-Arian, Randy E. Bolling: Improving the Testability of VLSI Circuits through Partitioning. ISCAS 1994: 199-202
	1993
j1		Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian: A Method for Consistent Fault Coverage Reporting. IEEE Design & Test of Computers 10(3): 68-79 (1993)
	1992
c7		Sami A. Al-Arian, Musaed A. Al-Kharji: Fault Simulation and Test Generation by Fault Sampling Techniques. ICCD 1992: 365-368
	1991
c6		Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel: A Unique Approach to Built-in-Self-Test Circuit Design. ICCD 1991: 270-274
	1990
c5		Sami A. Al-Arian, Hari P. Kunamneni: Three approaches to design fault tolerant programmable logic arrays. ACM Southeast Regional Conference 1990: 151-158
c4		Hussam Y. Abujbara, Sami A. Al-Arian: Self-testing and self-reconfiguration architecture for 2-D WSI arrays. SPDP 1990: 527-530
	1989
c3		Sami A. Al-Arian: Design and Test in the Universities. ITC 1989: 245-245
	1988
c2		Sami A. Al-Arian, Kevin A. Kwiat: Defining a Standard for Fault Simulator Evaluation. ITC 1988: 1001
	1984
c1		Dharma P. Agrawal, Sami A. Al-Arian: Comprehensive Fault Model and Testing of CMOS Circuits. ITC 1984: 218-223

Coauthor Index

1	Hussam Y. Abujbara	[c6] [c4]
2	Dharma P. Agrawal	[c1]
3	Musaed A. Al-Kharji	[c11] [c7]
4	Stephan P. Athan	[c10]
5	Randy E. Bolling	[c9] [c8]
6	Warren H. Debany Jr.	[j1]
7	Hari P. Kunamneni	[c5]
8	Kevin A. Kwiat	[j1] [c2]
9	David L. Landis	[j3] [j2] [c13] [c12] [c10]
10	Jim C. Ruel	[c6]
11	Bassam Shaer	[j3] [j2] [c13] [c12]

Colors in the list of coauthors

Last update Fri May 24 09:14:04 2013 CET by the DBLP Team —

Data released under the ODC-BY 1.0 license — See also our legal information page