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 | 2010 | |
|---|---|---|
| j2 |      | Rudolf Schlangen, Hervé Deslandes, Ted Lundquist, C. Schmidt, F. Altmann, K. Yu, A. Andreasyan, S. Li: Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectronics Reliability 50(9-11): 1454-1458 (2010) |
| 2006 | ||
| j1 | | O. Breitenstein, F. Altmann, T. Riediger, D. Karg, V. Gottschalk: Lock-in thermal IR imaging using a solid immersion lens. Microelectronics Reliability 46(9-11): 1508-1513 (2006) |
| 1 | A. Andreasyan | |
| 2 | O. Breitenstein | |
| 3 | Hervé Deslandes | |
| 4 | V. Gottschalk | |
| 5 | D. Karg | |
| 6 | S. Li | |
| 7 | Ted Lundquist | |
| 8 | T. Riediger | |
| 9 | Rudolf Schlangen | |
| 10 | C. Schmidt | |
| 11 | K. Yu |
Colors in the list of coauthors
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