Stefano Aresu

K. Rott, H. Reisinger, Stefano Aresu, Christian Schlünder, K. Kölpin, Wolfgang Gustin, Tibor Grasser: New insights on the PBTI phenomena in SiON pMOSFETs. Microelectronics Reliability 52(9-10): 1891-1894 (2012)

Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin: NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectronics Reliability 48(8-9): 1310-1312 (2008)

Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll: Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. Microelectronics Reliability 48(8-9): 1490-1493 (2008)

Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin: New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. Microelectronics Reliability 48(8-9): 1509-1512 (2008)

Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll: Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectronics Reliability 47(9-11): 1416-1418 (2007)

Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu: Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. Microelectronics Reliability 47(9-11): 1512-1516 (2007)

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)

Stefano Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO₂ at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)