Keith Baker

Karsten Øster Lundqvist, Keith Baker, Shirley Williams: Ontology supported competency system. IJKL 7(3/4): 197-219 (2011)

Keith Baker: Torque Kills! Future Control of the Ambient Electromagnetic Spectrum. IEEE MultiMedia 14(1): 4-8 (2007)

Keith Baker: Intrusive Interactivity Is Not an Ambient Experience. IEEE MultiMedia 13(2): 4-7 (2006)

Ian T. Foster, Jerry Gieraltowski, Scott Gose, Natalia Maltsev, Edward N. May, Alex Rodriguez, Dinanath Sulakhe, A. Vaniachine, Jim Shank, Saul Youssef, David Adams, Richard Baker, Wensheng Deng, Jason Smith, Dantong Yu, Iosif Legrand, Suresh Singh, Conrad Steenberg, Yang Xia, M. Anzar Afaq, Eileen Berman, James Annis, L. A. T. Bauerdick, Michael Ernst, Ian Fisk, Lisa Giacchetti, Gregory E. Graham, Anne Heavey, Joseph Kaiser, Nickolai Kuropatkin, Ruth Pordes, Vijay Sekhri, John Weigand, Yujun Wu, Keith Baker, Lawrence Sorrillo, John Huth, Matthew Allen, Leigh Grundhoefer, John Hicks, Fred Luehring, Steve Peck, Robert Quick, Stephen C. Simms, George Fekete, Jan vandenBerg, Kihyeon Cho, Kihwan Kwon, Dongchul Son, Hyoungwoo Park, Shane Canon, Keith R. Jackson, David E. Konerding, Jason Lee, Doug Olson, Iwona Sakrejda, Brian Tierney, Mark Green, Russ Miller, James Letts, Terrence Martin, David Bury, Catalin Dumitrescu, Daniel Engh, Robert Gardner, Marco Mambelli, Yuri Smirnov, Jens-S. Vöckler, Michael Wilde, Yong Zhao, Xin Zhao, Paul Avery, Richard Cavanaugh, Bockjoo Kim, Craig Prescott, Jorge Luis Rodriguez, Andrew Zahn, Shawn McKee, Christopher T. Jordan, James E. Prewett, Timothy L. Thomas, Horst Severini, Ben Clifford, Ewa Deelman, Larry Flon, Carl Kesselman, Gaurang Mehta, Nosa Olomu, Karan Vahi, Kaushik De, Patrick McGuigan, Mark Sosebee, Dan Bradley, Peter Couvares, Alan DeSmet, Carey Kireyev, Erik Paulson, Alain Roy, Scott Koranda, Brian Moe, Bobby Brown, Paul Sheldon: The Grid2003 Production Grid: Principles and Practice. HPDC 2004: 236-245

Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg: Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC 2000: 95-104

Keith Baker: SIA Roadmaps: Sunset Boulevard for l_DDQ. ITC 1999: 1121

Keith Baker: Spice up your life: simulate mixed-signal ICs! ITC 1998: 1131

Keith Baker, Jos van Beers: Shmoo Plotting: The Black Art of IC Testing. IEEE Design & Test of Computers 14(3): 90-97 (1997)

Keith Baker, Jos van Beers: Shmoo Plots - the Black Art of IC Test. ITC 1996: 932-933

Keith Baker, Alan Hales: Plug-and-Play IDDQ Testing for Test Fixtures. IEEE Design & Test of Computers 12(3): 53-61 (1995)

Keith Baker: Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say? ITC 1995: 299

Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen: Plug & Play I_DDQ Monitoring with QTAG. ITC 1995: 739-749

Keith Baker: QTAG: A Standard for Test Fixture Based I_DDQ/I_SSQ Monitors. ITC 1994: 194-202

Keith Baker, A. Bratt, Andrew M. D. Richardson, A. Welbers: Development of a CLASS 1 QTAG Monitor. ITC 1994: 213-222

R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker: Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649

Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans: Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. ITC 1994: 747-756

M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess: Parameter Monitoring: Advantages and Pitfalls. ITC 1993: 115-124

Keith Baker: Time-to-Market: An Issue in Mixed-signal vs. Analogue. ITC 1992: 254

Bas Verhelst, Richard Morren, Keith Baker: Using EDIF for Transfer of Test Data: Practical Experience. ITC 1992: 459-465

R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker: Improving Total IC Design Quality Using Application Mode Testing. ITC 1992: 866-872

Kate Crennell, Keith Baker: 5th Alvey vision Conference. Image Vision Comput. 8(1): 2-3 (1990)

Keith Baker, Bas Verhelst: I_DDQ testing because `zero defects isn't enough': a Philips perspective. ITC 1990: 253-254

R. Mehtani, Keith Baker, C. M. Huizer, P. J. Hynes, Jos van Beers: Macro-testability and the VSP. ITC 1990: 739-748

S. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter: A Fast Signature Simulation Tool for Built-In Self-Testing Circuits. DAC 1987: 17-25

Prab Varma, Anthony P. Ambler, Keith Baker: An Analysis of the Economics of Self Test. ITC 1984: 20-30