Hari Balachandran

Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran: K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. ITC 2004: 223-231

Hari Balachandran, Kenneth M. Butler, Neil Simpson: Facilitating Rapid First Silicon Debug. ITC 2002: 628-637

Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli: Logic mapping on a microprocessor. ITC 2000: 701-710

Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler: Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738

Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana: Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. VTS 2000: 444-452

Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala: Expediting ramp-to-volume production. ITC 1999: 103-112

Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith: Correlation of logical failures to a suspect process step. ITC 1999: 458-476

Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana: Clustering based techniques for I_DDQ testing. ITC 1999: 730-737

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274

Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess: On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757

Hari Balachandran, D. M. H. Walker: Improvement of SRAM-based failure analysis using calibrated Iddq testing. VTS 1996: 130-137