| 2007 | ||
|---|---|---|
| j1 | David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: Securing Scan Control in Crypto Chips. J. Electronic Testing 23(5): 457-464 (2007) | |
| c8 | Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel: Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. IOLTS 2007: 185-186 | |
| 2006 | ||
| c7 | David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: A secure scan design methodology. DATE 2006: 1177-1178 | |
| c6 | David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: Secure Scan Techniques: A Comparison. IOLTS 2006: 119-124 | |
| c5 | Nicolas Valette, Lionel Torres, Gilles Sassatelli, Frédéric Bancel: Securing embedded programmable gate arrays in secure circuits. IPDPS 2006 | |
| 2005 | ||
| c4 | Nicolas Valette, Lionel Torres, Frédéric Bancel, Nicolas Bérard: Integration of Reconfigurable Logic on Secure Circuits. ReCoSoC 2005: 163-168 | |
| 2004 | ||
| c3 | David Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell: Scan Design and Secure Chip. IOLTS 2004: 219-226 | |
| 1993 | ||
| c2 | Yves Bertrand, Frédéric Bancel, Michel Renovell: Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. ITC 1993: 989-997 | |
| c1 | Yves Bertrand, Frédéric Bancel, Michel Renovell: A DFT Technique to Improve ATPG Efficiency for Sequential Circuits. VLSI Design 1993: 51-54 | |
| 1 | Yves Bertrand | |
| 2 | Nicolas Bérard | |
| 3 | Olivier Faurax | |
| 4 | Marie-Lise Flottes | |
| 5 | Laurent Freund | |
| 6 | David Hély | |
| 7 | Michel Renovell | |
| 8 | Bruno Rouzeyre | |
| 9 | Gilles Sassatelli | |
| 10 | Lionel Torres | |
| 11 | Assia Tria | |
| 12 | Nicolas Valette |
Colors in the list of coauthors
Last update Mon May 20 01:25:56 2013 CET by the DBLP Team —
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