M. Beck

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	2009
j2		V. Born, M. Beck, O. Bosholm, D. Dalleau, S. Glenz, I. Haverkamp, G. Kurz, F. Lange, A. Vest: Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity. Microelectronics Reliability 49(1): 74-78 (2009)
	2006
c3		Jonghyun Lee, Robert B. Ross, S. Atchley, M. Beck, Rajeev Thakur: MPI-IO/L: efficient remote I/O for MPI-IO via logistical networking. IPDPS 2006
	2002
j1		M. Beck, S. Robins: Explicit and Efficient Formulas for the Lattice Point Count in Rational Polygons Using Dedekind - Rademacher Sums. Discrete & Computational Geometry 27(4): 443-459 (2002)
	1999
c2		M. Beck, Prabhudev Konana, Guangtian Liu, Yanbin Liu, Aloysius K. Mok: Active and Real-Time Functionalities for Electronic Brokerage Design. WECWIS 1999: 30-35
	1997
c1		Ian C. Parmee, M. Beck: An Evolutionary, Agent-Assisted Strategy for Conceptual Design Space Decomposition. Evolutionary Computing, AISB Workshop 1997: 275-286

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