| 2013 | ||
|---|---|---|
| j22 | Ralf Behr, Oliver F. Kieler, Detlef Schleubner, Luis Palafox, Franz-Josef Ahlers: Combining Josephson Systems for Spectrally Pure AC Waveforms With Large Amplitudes. IEEE T. Instrumentation and Measurement 62(6): 1634-1639 (2013) | |
| 2012 | ||
| j21 | Olivier Seron, Sophie Djordjevic, Ilya Budovsky, Thomas Hagen, Ralf Behr, Luis Palafox: Precision AC-DC Transfer Measurements With a Josephson Waveform Synthesizer and a Buffer Amplifier. IEEE T. Instrumentation and Measurement 61(1): 198-204 (2012) | |
| 2011 | ||
| j20 | Jinnie Lee, Jürgen Schurr, Jaani Nissilä, Luis Palafox, Ralf Behr, Bryan P. Kibble: Programmable Josephson Arrays for Impedance Measurements. IEEE T. Instrumentation and Measurement 60(7): 2596-2601 (2011) | |
| 2009 | ||
| j19 | Johannes Kohlmann, Oliver F. Kieler, R. Iuzzolino, Jinnie Lee, Ralf Behr, B. Egeling, Franz Müller: Development and Investigation of SNS Josephson Arrays for the Josephson Arbitrary Waveform Synthesizer. IEEE T. Instrumentation and Measurement 58(4): 797-802 (2009) | |
| j18 | Jinnie Lee, Ralf Behr, Alexander S. Katkov, Luis Palafox: Modeling and Measuring Error Contributions in Stepwise Synthesized Josephson Sine Waves. IEEE T. Instrumentation and Measurement 58(4): 803-808 (2009) | |
| j17 | Luis Palafox, Ralf Behr, Waldemar G. Kürten Ihlenfeld, Franz Müller, Enrico Mohns, Michael Seckelmann, Franz-Josef Ahlers: The Josephson-Effect-Based Primary AC Power Standard at the PTB: Progress Report. IEEE T. Instrumentation and Measurement 58(4): 1049-1053 (2009) | |
| 2007 | ||
| j16 | Ralf Behr, Luis Palafox, Günther Ramm, Harald Moser, J. Melcher: Direct Comparison of Josephson Waveforms Using an AC Quantum Voltmeter. IEEE T. Instrumentation and Measurement 56(2): 235-238 (2007) | |
| j15 | Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr: Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 56(2): 289-294 (2007) | |
| j14 | Johannes Kohlmann, Franz Müller, Oliver F. Kieler, Ralf Behr, Luis Palafox, M. Kahmann, Jürgen Niemeyer: Josephson Series Arrays for Programmable 10-V SINIS Josephson Voltage Standards and for Josephson Arbitrary Waveform Synthesizers Based on SNS Junctions. IEEE T. Instrumentation and Measurement 56(2): 472-475 (2007) | |
| j13 | Luis Palafox, Günther Ramm, Ralf Behr, Waldemar G. Kürten Ihlenfeld, Harald Moser: Primary AC Power Standard Based on Programmable Josephson Junction Arrays. IEEE T. Instrumentation and Measurement 56(2): 534-537 (2007) | |
| j12 | Jonathan M. Williams, Dale Henderson, Pravin Patel, Ralf Behr, Luis Palafox: Achieving Sub-100-ns Switching of Programmable Josephson Arrays. IEEE T. Instrumentation and Measurement 56(2): 651-654 (2007) | |
| 2005 | ||
| j11 | Ralf Behr, Jonathan M. Williams, Pravin Patel, Theodoor J. B. M. Janssen, Torsten Funck, Manfred Klonz: Synthesis of precision waveforms using a SINIS Josephson junction array. IEEE T. Instrumentation and Measurement 54(2): 612-615 (2005) | |
| j10 | Oleg A. Chevtchenko, Helko E. van den Brom, Ernest Houtzager, Ralf Behr, Johannes Kohlmann, Jonathan M. Williams, Theodoor J. B. M. Janssen, Luis Palafox, David A. Humphreys, François P. M. Piquemal, Sophie Djordjevic, O. Monnoye, André Poletaeff, Rado Lapuh, Karl-Erik Rydler, Gunnar Eklund: Realization of a quantum standard for AC voltage: overview of a European research project. IEEE T. Instrumentation and Measurement 54(2): 628-631 (2005) | |
| j9 | Waldemar G. Kürten, Enrico Mohns, Ralf Behr, Jonathan M. Williams, Pravin Patel, Günther Ramm, Hans Bachmair: Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source. IEEE T. Instrumentation and Measurement 54(2): 649-652 (2005) | |
| 2004 | ||
| j8 | Ralf Behr, Marco Schubert, Torsten May: Accuracy of a cryocooler-based programmable Josephson Voltage standard. IEEE T. Instrumentation and Measurement 53(3): 822-825 (2004) | |
| 2003 | ||
| j7 | Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs, Heikki Seppä: Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays. IEEE T. Instrumentation and Measurement 52(2): 516-520 (2003) | |
| j6 | Ralf Behr, Torsten Funck, Bernd Schumacher, Peter Warnecke: Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays. IEEE T. Instrumentation and Measurement 52(2): 521-523 (2003) | |
| j5 | Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö: Analysis of different measurement setups for a programmable Josephson voltage standard. IEEE T. Instrumentation and Measurement 52(2): 524-528 (2003) | |
| 2001 | ||
| j4 | Ralf Behr, L. Grimm, Torsten Funck, Johannes Kohlmann, Holger Schulze, Franz Müller, Bernd Schumacher, Peter Warnecke, Jürgen Niemeyer: Application of Josephson series arrays to a DC quantum voltmeter. IEEE T. Instrumentation and Measurement 50(2): 185-187 (2001) | |
| j3 | Johannes Kohlmann, Holger Schulze, Ralf Behr, Franz Müller, Jürgen Niemeyer: 10 V SINIS Josephson junction series arrays for programmable voltage standards. IEEE T. Instrumentation and Measurement 50(2): 192-194 (2001) | |
| j2 | Ralf Behr, Jürgen Niemeyer, Alexander S. Katkov: Comparison of the Josephson voltage standards of VNIIM and PTB. IEEE T. Instrumentation and Measurement 50(2): 203-205 (2001) | |
| j1 | Torsten Funck, Ralf Behr, Manfred Klonz: Fast reversed DC measurements on thermal converters using a SINIS Josephson junction array. IEEE T. Instrumentation and Measurement 50(2): 322-325 (2001) | |
Data released under the ODC-BY 1.0 license — See also our legal information page