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 | 2006 | |
|---|---|---|
| c5 |      | Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich: Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. ITC 2006: 1-9 |
| 2005 | ||
| c4 | | Nandu Tendolkar, Dawit Belete, Ashutosh Razdan, Hereman Reyes, Bill Schwarz, Marie Sullivan: Test methodology for Freescale's high performance e600 core based on PowerPC/spl reg/ instruction set architecture. ITC 2005: 9 |
| 2002 | ||
| c3 | | Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger: Silicon Symptoms to Solutions: Applying Design for Debug Techniques. ITC 2002: 664-672 |
| c2 | | Dawit Belete, Ashutosh Razdan, William Schwarz, Rajesh Raina, Christopher Hawkins, Jeff Morehead: Use of DFT Techniques In Speed Grading a 1GHz+ Microprocessor . ITC 2002: 1111-1119 |
| 2000 | ||
| c1 | | Rajesh Raina, Robert Bailey, Dawit Belete, Vikram Khosa, Robert F. Molyneaux, Javier Prado, Ashutosh Razdan: DFT advances in Motorola's Next-Generation 74xx PowerPCTM microprocessor. ITC 2000: 131-140 |
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