Brady Benware

Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann: Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Design & Test of Computers 29(1): 8-18 (2012)

Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware: Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing 27(5): 599-609 (2011)

Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware: On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. European Test Symposium 2011: 1-6

Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab: A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9

Manish Sharma, Chris Schuermyer, Brady Benware: Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Design & Test of Computers 27(3): 54-61 (2010)

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of failing scan cells through orthogonal response compaction. European Test Symposium 2010: 221-226

Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen: Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818

Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware: Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS 2009: 167-172

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann: Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9

Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware: Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. European Test Symposium 2007: 145-150

Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware: Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270

Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware: A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10

Joel Lurkins, D. Hill, Brady Benware: Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC 2005: 7

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware: Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9

Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch: The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10

Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch: Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432

Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212

Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294

Brady Benware: Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC 2004: 1418

Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware: Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192

Robert Madge, Brady Benware, W. Robert Daasch: Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003)

Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning: Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573

Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040

Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46