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H. El Brouji
E.-Hassane El Brouji
2010 – today
- 2010
[j5]Olivier Briat, J.-M. Vinassa, Nicolas Bertrand, H. El Brouji, J.-Y. Delétage, Eric Woirgard: Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling. Microelectronics Reliability 50(9-11): 1796-1803 (2010)
2000 – 2009
- 2009
[j4]H. El Brouji, Olivier Briat, J.-M. Vinassa, H. Henry, E. Woirgard: Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions. Microelectronics Reliability 49(9-11): 1391-1397 (2009)
[j3]E.-Hassane El Brouji, Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, Eric Woirgard: Impact of Calendar Life and Cycling Ageing on Supercapacitor Performance. IEEE T. Vehicular Technology 58(8): 3917-3929 (2009)- 2008
[j2]H. El Brouji, Olivier Briat, J.-M. Vinassa, Nicolas Bertrand, E. Woirgard: Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests. Microelectronics Reliability 48(8-9): 1473-1478 (2008)- 2007
[j1]W. Lajnef, J.-M. Vinassa, Olivier Briat, H. El Brouji, E. Woirgard: Monitoring fading rate of ultracapacitors using online characterization during power cycling. Microelectronics Reliability 47(9-11): 1751-1755 (2007)
Coauthor Index
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last updated on 2013-05-09 22:07 CEST by the dblp team



