Paulo Marcos Siqueira Bueno

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	2008
c5		Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Clenio F. Salviano, Mario Jino: Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. JIISIC 2008: 147-154
c4		Paulo Marcos Siqueira Bueno, W. Eric Wong, Mario Jino: Automatic test data generation using particle systems. SAC 2008: 809-814
	2006
c3		Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Mario Jino: Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. PROFES 2006: 263-277
	2002
j1		Paulo Marcos Siqueira Bueno, Mario Jino: Automatic Test Data Generation for Program Paths Using Genetic Algorithms. International Journal of Software Engineering and Knowledge Engineering 12(6): 691-709 (2002)
	2001
c2		Paulo Marcos Siqueira Bueno, Mario Jino: Automatic Test Data Generation for Program Paths Using Genetic Algorithms. SEKE 2001: 2-9
	2000
c1		Paulo Marcos Siqueira Bueno, Mario Jino: Identification of Potentially Infeasible Program Paths by Monitoring the Search for Test Data. ASE 2000: 209-218

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