Al Burk

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	2009
j1		Peter G. Muzykov, Robert M. Kennedy, Qingchun Zhang, Craig Capell, Al Burk, Anant Agarwal, Tangali S. Sudarshan: Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors. Microelectronics Reliability 49(1): 32-37 (2009)

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