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 | 2010 | |
|---|---|---|
| j5 |      | Markus Grützner, Christian Burmer, Christof Brillert: Ultra-fast CAD scan chain highlighting for failure analysis assistance. Microelectronics Reliability 50(9-11): 1494-1498 (2010) |
| 2008 | ||
| j4 | | Liming Gao, Christian Burmer: PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization. Microelectronics Reliability 48(8-9): 1349-1353 (2008) |
| 2007 | ||
| j3 | | Peter Egger, Markus Grützner, Christian Burmer, Fabien Dudkiewicz: Application of time resolved emission techniques within the failure analysis flow. Microelectronics Reliability 47(9-11): 1545-1549 (2007) |
| 2006 | ||
| j2 | | Liming Gao, Christian Burmer, Frank Siegelin: ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectronics Reliability 46(9-11): 1458-1463 (2006) |
| j1 | | Christian Burmer, Siegfried Görlich: Failure analyses for debug and ramp-up of modern IC's. Microelectronics Reliability 46(9-11): 1486-1497 (2006) |
| 1 | Christof Brillert | |
| 2 | Fabien Dudkiewicz | |
| 3 | Peter Egger | |
| 4 | Liming Gao | |
| 5 | Markus Grützner | |
| 6 | Siegfried Görlich | |
| 7 | Frank Siegelin |
Colors in the list of coauthors
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