Charles J. Burroughs

Piotr S. Filipski, Michael Boecker, Samuel P. Benz, Charles J. Burroughs: Experimental Determination of the Voltage Lead Error in an AC Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 60(7): 2387-2392 (2011)

Charles J. Burroughs, Paul D. Dresselhaus, Alain Rüfenacht, David Olaya, Michael M. Elsbury, Yi-Hua Tang, Samuel P. Benz: NIST 10 V Programmable Josephson Voltage Standard System. IEEE T. Instrumentation and Measurement 60(7): 2482-2488 (2011)

Charles J. Burroughs, Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus: Systematic Error Analysis of Stepwise-Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 58(4): 761-767 (2009)

Alain Rüfenacht, Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson: Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 58(4): 809-815 (2009)

Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs, Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus: AC Power Standard Using a Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 58(4): 1041-1048 (2009)

Oliver F. Kieler, Regis Pinheiro Landim, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs: AC-DC Transfer Standard Measurements and Generalized Compensation With the AC Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 57(4): 791-796 (2008)

Regis Pinheiro Landim, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs: Systematic-Error Signals in the AC Josephson Voltage Standard: Measurement and Reduction. IEEE T. Instrumentation and Measurement 57(6): 1215-1220 (2008)

Charles J. Burroughs, Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson: Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 57(7): 1322-1329 (2008)

Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr: Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 56(2): 289-294 (2007)

John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs: Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE T. Instrumentation and Measurement 56(2): 481-485 (2007)

Yonuk Chong, Charles J. Burroughs, Paul D. Dresselhaus, Nicolas Hadacek, Hirotake Yamamori, Samuel P. Benz: 2.6-V high-resolution programmable Josephson voltage standard circuits using double-stacked MoSi₂-barrier junctions. IEEE T. Instrumentation and Measurement 54(2): 616-619 (2005)

Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Yonuk Chong: Precision measurements of AC Josephson voltage standard operating margins. IEEE T. Instrumentation and Measurement 54(2): 624-627 (2005)

Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs, Wes Tew, Rod White, John M. Martinis: Progress on Johnson noise thermometry using a quantum voltage noise source for calibration. IEEE T. Instrumentation and Measurement 54(2): 653-657 (2005)

Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs, Heikki Seppä: Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays. IEEE T. Instrumentation and Measurement 52(2): 516-520 (2003)

Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus: AC Josephson voltage standard error measurements and analysis. IEEE T. Instrumentation and Measurement 52(2): 542-544 (2003)

Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus, L. A. Christina: AC and DC voltages from a Josephson arbitrary waveform synthesizer. IEEE T. Instrumentation and Measurement 50(2): 181-184 (2001)

Blaise Jeanneret, Alain Rüfenacht, Charles J. Burroughs: High precision comparison between SNS and SIS Josephson voltage standards. IEEE T. Instrumentation and Measurement 50(2): 188-191 (2001)

Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs: Nanotechnology for next generation Josephson voltage standards. IEEE T. Instrumentation and Measurement 50(6): 1513-1518 (2001)