Marco Buzzo

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	2006
j3		Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner: Characterization of photonic devices by secondary electron potential contrast. Microelectronics Reliability 46(9-11): 1536-1541 (2006)
	2005
j2		Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner: Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectronics Reliability 45(9-11): 1499-1504 (2005)
	2002
j1		Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner: Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectronics Reliability 42(9-11): 1701-1706 (2002)

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