José Vicente Calvano Coauthor index pubzone.org

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DBLP keys2007
j2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electronic Testing 23(6): 497-512 (2007)
i1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho: Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. CoRR abs/0710.4725 (2007)
2006
c7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333
2005
c6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho: Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. DATE 2005: 174-175
2004
c5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho: ATPG for fault diagnosis on analog electrical networks using evolutionary techniques. SBCCI 2004: 100-104
2003
c4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
José Vicente Calvano, Marcelo Lubaszewski: Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256
2002
c3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
José Vicente Calvano, Vladimir Castro Alves, Antônio C. Mesquita, Marcelo Lubaszewski: Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206
2001
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski: Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electronic Testing 17(2): 121-138 (2001)
2000
c2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96-
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324

Coauthor Index

1Vladimir Castro Alves
[c3] [j1] [c2] [c1]
2Tiago R. Balen (Tiago Roberto Balen)
[j2] [c7]
3Claudio C. Czendrodi
[i1] [c6] [c5]
4Antonio Carneiro de Mesquita Filho
[i1] [c6] [c5] [j1]
5Marcelo Lubaszewski
[j2] [c7] [c4] [c3] [j1] [c2] [c1]
6Antônio C. Mesquita
[c3]
7Michel Renovell
[j2] [c7]
8Carlos Eduardo Savioli
[i1] [c6] [c5]
Last update Mon May 20 23:34:04 2013 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page