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 | 2010 | |
|---|---|---|
| j4 |      | Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Begueret: Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. J. Electronic Testing 26(3): 355-365 (2010) |
| 2009 | ||
| c7 | | Luca Testa, Hervé Lapuyade, Yann Deval, Olivier Mazouffre, Jean-Louis Carbonéro, Jean-Baptiste Begueret: BIST scheme for RF VCOs allowing the self-correction of the cut. ITC 2009: 1-10 |
| 2008 | ||
| j3 | | Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Decreasing Test Qualification Time in AMS and RF Systems. IEEE Design & Test of Computers 25(1): 29-37 (2008) |
| j2 | | Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008 (2008) |
| 2007 | ||
| c6 | | Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro: Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736 |
| c5 | | Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba: A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. ITC 2007: 1-10 |
| c4 | | Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211 |
| 2006 | ||
| j1 | | Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006) |
| c3 |  | Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro: Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118 |
| c2 | | Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319 |
| 2005 | ||
| c1 | | Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171 |
Colors in the list of coauthors
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