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 | 2012 | |
|---|---|---|
| j13 |      | Alessandro Savino, Stefano Di Carlo, Gianfranco Politano, Alfredo Benso, Alberto Bosio, Giorgio Di Natale: Statistical Reliability Estimation of Microprocessor-Based Systems. IEEE Trans. Computers 61(11): 1521-1534 (2012) |
| j12 | | Cataldo Basile, Stefano Di Carlo, Alberto Scionti: FPGA-Based Remote-Code Integrity Verification of Programs in Distributed Embedded Systems. IEEE Transactions on Systems, Man, and Cybernetics, Part C 42(2): 187-200 (2012) |
| c49 | | Hafeez Ur Rehman, Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Alessandro Savino, Prashanth Suravajhala: Combining homolog and motif similarity data with Gene Ontology relationships for protein function prediction. BIBM 2012: 1-4 |
| c48 | | C. Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, D. Bertozzi: A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. DATE 2012: 881-886 |
| 2011 | ||
| j11 | | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Alessandro Savino, Hafeez Hafeezurrehman: Building gene expression profile classifiers with a simple and efficient rejection option in R. BMC Bioinformatics 12(S-13): S3 (2011) |
| j10 | | Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin: Efficient multi-level fault simulation of HW/SW systems for structural faults. SCIENCE CHINA Information Sciences 54(9): 1784-1796 (2011) |
| j9 | | Stefano Di Carlo, Matteo Falasconi, Ernesto Sánchez, Alberto Scionti, Giovanni Squillero, Alberto Paolo Tonda: Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation. Pattern Recognition Letters 32(13): 1594-1603 (2011) |
| j8 | | Stefano Di Carlo, Paolo Prinetto, Alessandro Savino: Software-Based Self-Test of Set-Associative Cache Memories. IEEE Trans. Computers 60(7): 1030-1044 (2011) |
| j7 | | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano: A cDNA Microarray Gene Expression Data Classifier for Clinical Diagnostics Based on Graph Theory. IEEE/ACM Trans. Comput. Biology Bioinform. 8(3): 577-591 (2011) |
| c47 | | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, Paolo Prinetto: MarciaTesta: An Automatic Generator of Test Programs for Microprocessors' Data Caches. Asian Test Symposium 2011: 401-406 |
| c46 | | Stefano Di Carlo, Gianfranco Politano, Paolo Prinetto, Alessandro Savino, Alberto Scionti: Genetic Defect Based March Test Generation for SRAM. EvoApplications (2) 2011: 141-150 |
| c45 | | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, Paolo Prinetto: A unifying formalism to support automated synthesis of SBSTs for embedded caches. EWDTS 2011: 39-42 |
| 2010 | ||
| c44 | | Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto: Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. Asian Test Symposium 2010: 3-8 |
| c43 | | Stefano Di Carlo, Andrea Miele, Paolo Prinetto, Antonio Trapanese: Microprocessor fault-tolerance via on-the-fly partial reconfiguration. European Test Symposium 2010: 201-206 |
| c42 | | Stefano Di Carlo, Matteo Falasconi, Ernesto Sánchez, Alberto Scionti, Giovanni Squillero, Alberto Paolo Tonda: Exploiting Evolution for an Adaptive Drift-Robust Classifier in Chemical Sensing. EvoApplications (1) 2010: 412-421 |
| c41 | | Stefano Di Carlo, Michele Fabiano, Roberto Piazza, Paolo Prinetto: Exploring modeling and testing of NAND flash memories. EWDTS 2010: 47-50 |
| c40 | | Stefano Di Carlo, Michele Fabiano, Roberto Piazza, Paolo Prinetto: EDACs and test integration strategies for NAND flash memories. EWDTS 2010: 218-221 |
| c39 | | Stefano Di Carlo, Ernesto Sánchez, Alberto Scionti, Giovanni Squillero, Alberto Paolo Tonda, Matteo Falasconi: Towards drift correction in chemical sensors using an evolutionary strategy. GECCO 2010: 1329-1330 |
| c38 | | Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto: System reliability evaluation using concurrent multi-level simulation of structural faults. ITC 2010: 817 |
| 2009 | ||
| j6 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Paolo Prinetto: Are IEEE-1500-Compliant Cores Really Compliant to the Standard?. IEEE Design & Test of Computers 26(3): 16-24 (2009) |
| c37 | | Stefano Di Carlo, Paolo Prinetto, Alberto Scionti: A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems. Asian Test Symposium 2009: 125-130 |
| c36 | | Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto: Test exploration and validation using transaction level models. DATE 2009: 1250-1253 |
| c35 | | Stefano Di Carlo, Nadereh Hatami, Paolo Prinetto, Alessandro Savino: System Level Testing via TLM 2.0 Debug Transport Interface. DFT 2009: 286-294 |
| c34 | | Maurizio Caramia, Stefano Di Carlo, Michele Fabiano, Paolo Prinetto: FLARE: A design environment for FLASH-based space applications. HLDVT 2009: 14-19 |
| c33 | | Stefano Di Carlo, Nadereh Hatami, Paolo Prinetto: Test infrastructures evaluation at transaction level. ITC 2009: 1 |
| 2008 | ||
| j5 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008) |
| j4 | | Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian: IEEE Standard 1500 Compliance Verification for Embedded Cores. IEEE Trans. VLSI Syst. 16(4): 397-407 (2008) |
| c32 | | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Luca Sterpone: Differential gene expression graphs: A data structure for classification in DNA microarrays. BIBE 2008: 1-6 |
| c31 | | Alfredo Benso, Stefano Di Carlo, Gianfranco Politano, Luca Sterpone: A graph-based representation of Gene Expression profiles in DNA microarrays. CIBCB 2008: 75-82 |
| c30 | | Simone Alpe, Stefano Di Carlo, Paolo Prinetto, Alessandro Savino: Applying March Tests to K-Way Set-Associative Cache Memories. European Test Symposium 2008: 77-83 |
| c29 | | Homa Alemzadeh, Zainalabedin Navabi, Stefano Di Carlo, Alberto Scionti, Paolo Prinetto: Functional testing approaches for "BIFST-able" tlm_fifo. HLDVT 2008: 85-92 |
| c28 | | Stefano Di Carlo, Paolo Prinetto, Alberto Scionti, Zaid Al-Ars: Automating defects simulation and fault modeling for SRAMs. HLDVT 2008: 169-176 |
| c27 | | Homa Alemzadeh, Stefano Di Carlo, Fatemeh Refan, Paolo Prinetto, Zainalabedin Navabi: "Plug & Test" at System Level via Testable TLM Primitives. ITC 2008: 1-10 |
| 2007 | ||
| j3 | | Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs. IET Computers & Digital Techniques 1(3): 237-245 (2007) |
| c26 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Riccardo Mariani: A Functional Verification Based Fault Injection Environment. DFT 2007: 114-122 |
| c25 | | Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Alberto Bosio: Automating the IEEE std.1500 compliance verification for embedded cores. HLDVT 2007: 171-178 |
| c24 | | Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale: Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 |
| 2006 | ||
| c23 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263 |
| c22 |  | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158 |
| c21 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392 |
| c20 | | Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto: Single-Event Upset Analysis and Protection in High Speed Circuits. European Test Symposium 2006: 29-34 |
| c19 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A 22n March Test for Realistic Static Linked Faults in SRAMs. European Test Symposium 2006: 49-54 |
| 2005 | ||
| c18 | | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March AB, March AB1: new March tests for unlinked dynamic memory faults. ITC 2005: 8 |
| 2004 | ||
| c17 | | Marie-Lise Flottes, Yves Bertrand, L. Balado, Emili Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich: Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139 |
| 2003 | ||
| j2 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Online Self-Repair of FIR Filters. IEEE Design & Test of Computers 20(3): 50-57 (2003) |
| j1 | | Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian: A Hierarchical Infrastructure for SoC Test Management. IEEE Design & Test of Computers 20(4): 32-39 (2003) |
| c16 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148 |
| c15 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri: FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160 |
| c14 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Data Critically Estimation In Software Applications. ITC 2003: 802-810 |
| c13 | | Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden: Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86 |
| 2002 | ||
| c12 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97 |
| c11 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943 |
| c10 | | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto: Automated Synthesis of SEU Tolerant Architectures from OO Descriptions. IOLTW 2002: 26-31 |
| c9 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508 |
| 2001 | ||
| c8 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163 |
| c7 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303 |
| c6 | | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Hans-Joachim Wunderlich: On applying the set covering model to reseeding. DATE 2001: 156-161 |
| c5 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225 |
| c4 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto: Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8 |
| 2000 | ||
| c3 | | Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari: On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs. ICCD 2000: 539-540 |
| c2 | | Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni: A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566 |
| c1 | | Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Fabio Ricciato, Maurizio Spadari, Yervant Zorian: HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs. ITC 2000: 892-901 |
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