Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
F. Celi
2010 – today
- 2010
[j1]S. Libertino, D. Corso, G. Murè, A. Marino, F. Palumbo, F. Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, M. Lisiansky, Y. Roizin, Salvatore Lombardo: Radiation effects in nitride read-only memories. Microelectronics Reliability 50(9-11): 1857-1860 (2010)
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2012-12-02 20:29 CET by the dblp team



