Roberto Cerri

Giancarlo Marullo-Reedtz, Roberto Cerri, Wolfgang Waldmann, Jiri Streit, Pekka Immonen, Isabelle Blanc, Felix Raso, Torsten Funck, Bernd Schumacher, Erik F. Dierikx, Mario Nunes, Peter Vrabcek, Dusan Rudohradsky, Ove Gunnarsson, Karl-Erik Rydler, Blaise Jeanneret, Beat Jeckelmann, Thomas Pulfer, Saliha Selcik Turhan, Okan Yilmaz, Jonathan M. Williams, Harald Slinde, Kare Lind, Jacques Nicolas, Matjaz Lindic, Eirini Flouda, Gábor Erdös: Comparison EUROMET.EM-K8 of DC voltage ratio: results. IEEE T. Instrumentation and Measurement 54(2): 576-579 (2005)

Giancarlo Marullo-Reedtz, Roberto Cerri, Isabelle Blanc, Ove Gunnarsson, Jonathan M. Williams, Felix Raso, Kyu-Tae Kim, Robert B. Frenkel, Zhang Xiuzeng, Alexander S. Katkov, Ronald Dziuba, Mark Parker, Barry M. Wood, Laurie A. Christian, Eddie Tarnow, Surender K. Mahajan, Ajeet Singh, Yasuhiko Sakamoto: Comparison CCEM-K8 of DC voltage ratio: results. IEEE T. Instrumentation and Measurement 52(2): 419-423 (2003)

Giorgio Boella, Pier Paolo Capra, Cristina Cassiago, Roberto Cerri, Giancarlo Marullo-Reedtz, Andrea Sosso: Traceability of the 10-kΩ standard at IEN. IEEE T. Instrumentation and Measurement 50(2): 245-248 (2001)