K. S. Chen

S. H. Yang, J. Y. Sheu, M. K. Ieong, M. H. Chiang, T. Yamamoto, J. J. Liaw, S. S. Chang, Y. M. Lin, T. L. Hsu, J. R. Hwang, J. K. Ting, C. H. Wu, K. C. Ting, F. C. Yang, C. M. Liu, I. L. Wu, Y. M. Chen, S. J. Chent, K. S. Chen, J. Y. Cheng, M. H. Tsai, W. Chang, R. Chen, C. C. Chen, T. L. Lee, C. K. Lin, S. C. Yang, Y. M. Sheu, J. T. Tzeng, L. C. Lu, S. M. Jang, C. H. Diaz, Yuh-Jier Mii: 28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications. CICC 2011: 1-5

Chiao-Tzu Huang, K. S. Chen, Tsang-Chuan Chang: An application of DMADV methodology for increasing the yield rate of surveillance cameras. Microelectronics Reliability 50(2): 266-272 (2010)

K. S. Chen, C. C. Wang, C. H. Wang, C. F. Huang: Application of RPN analysis to parameter optimization of passive components. Microelectronics Reliability 2010: 2012-2019

K. S. Chen, T. W. Chen: Application of Fuzzy Relative Quality Performance Matrix on the Improvement of Critical to Quality Problems. FSKD (3) 2008: 356-360

K. S. Chen, C. H. Wang, H. T. Chen: A MAIC approach to TFT-LCD panel quality improvement. Microelectronics Reliability 46(7): 1189-1198 (2006)

Alongkorn Darawankul, Joel T. Johnson, K. S. Chen: Comparison of Surface Scattering Models for Gaussian and Exponential Surfaces. IGARSS 2006: 1036-1039

C. P. Chang, T. Y. Chang, C. T. Wang, C. H. Kuo, K. S. Chen: Land-surface deformation corresponding to seasonal ground-water fluctuation, determining by SAR interferometry in the SW Taiwan. Mathematics and Computers in Simulation 67(4-5): 351-359 (2004)

M. L. Huang, K. S. Chen, Y. H. Hung: Integrated process capability analysis with an application in backlight module. Microelectronics Reliability 42(12): 2009-2014 (2002)

K. S. Chen, Y. C. Tzeng, P. C. Chen: Retrieval of ocean winds from satellite scatterometer by a neural network. IEEE T. Geoscience and Remote Sensing 37(1): 247-256 (1999)

K. S. Chen, D. H. Tsay, W. P. Huang, Y. C. Tzeng: Remote sensing image segmentation using a Kalman filter-trained neural network. Int. J. Imaging Systems and Technology 7(2): 141-148 (1996)