Ming-Jing Chen

List of publications from the DBLP Bibliography Server - FAQ
Other views: by type - by year (modern) - classic-C

Ask others: ACM DL/Guide -

	2005
j1		Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara: Improving test effectiveness of scan-based BIST by scan chain partitioning. IEEE Trans. on CAD of Integrated Circuits and Systems 24(6): 916-927 (2005)
c3		Dong Xiang, Ming-Jing Chen, Hideo Fujiwara: Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST. Asian Test Symposium 2005: 126-131
	2004
c2		Dong Xiang, Ming-Jing Chen, Kaiwei Li, Yu-Liang Wu: Scan-Based BIST Using an Improved Scan Forest Architecture. Asian Test Symposium 2004: 88-93
	2003
c1		Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara: Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. Asian Test Symposium 2003: 12-17

Coauthor Index

Last update Thu May 23 12:05:47 2013 CET by the DBLP Team —

Data released under the ODC-BY 1.0 license — See also our legal information page