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 | 2012 | |
|---|---|---|
| c19 |      | Ram Chillarege: Targeting Specific Customer Satisfactions Issues with ODC Analysis. ISSRE Workshops 2012: 64 |
| 2010 | ||
| j10 | | Ram Chillarege, Jeffrey M. Voas: Guest Editors' Introduction: Reliability of Embedded and Cyber-Physical Systems. IEEE Security & Privacy 8(5): 12-13 (2010) |
| 2006 | ||
| c18 | | Ram Chillarege, P. Santhanam: "Tail-Splitting" to Predict Failing Software Modules - with a Case Study on an Operating Systems Product. ISSRE 2006: 191-196 |
| 2004 | ||
| j9 | | Daniel P. Siewiorek, Ram Chillarege, Zbigniew Kalbarczyk: Reflections on Industry Trends and Experimental Research in Dependability. IEEE Trans. Dependable Sec. Comput. 1(2): 109-127 (2004) |
| 2003 | ||
| c17 | | Dorron Levy, Ram Chillarege: Early Warning of Failures through Alarm Analysis - A Case Study in Telecom Voice Mail Systems. ISSRE 2003: 271-280 |
| 2002 | ||
| j8 | | Ram Chillarege: The Marriage of Business Dynamics and Software Engineering. IEEE Software 19(6): 43-49 (2002) |
| c16 | | Ram Chillarege, Kothanda Ram Prasad: Test and Development Process Retrospective - A Case Study using ODC Triggers. DSN 2002: 669-678 |
| 1998 | ||
| c15 | | Ram Chillarege, Robert W. Horst, Clifford B. Meltzer, Angelo Pruscino, Dalibor F. Vrsalovic: Vision for High-Availability of the Global Infrastructure (Panel). FTCS 1998: 2-4 |
| 1996 | ||
| c14 | | Jörgen Christmansson, Ram Chillarege: Generation of Error Set that Emulates Software Faults Based on Field Data. FTCS 1996: 304-313 |
| 1995 | ||
| c13 | | Ram Chillarege, Shriram Biyani, Jeanette Rosenthal: Measurement of Failure Rate in Widely Distributed Software. FTCS 1995: 424-433 |
| c12 | | Michael Buckley, Ram Chillarege: Discovering relationships between service and customer satisfaction. ICSM 1995: 192- |
| 1994 | ||
| j7 | | Inderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, C. Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa: In-Process Improvement through Defect Data Interpretation. IBM Systems Journal 33(1): 182-214 (1994) |
| j6 | | Michael J. Halliday, Inderpal S. Bhandari, Jarir K. Chaar, Ram Chillarege: Experiences in transferring a software process improvement methodology to production laboratories. Journal of Systems and Software 26(1): 61-68 (1994) |
| c11 | | Ram Chillarege: Self-testing software probe system for failure detection and diagnosis. CASCON 1994: 10 |
| 1993 | ||
| j5 | | Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege: In-Process Evaluation for Software Inspection and Test. IEEE Trans. Software Eng. 19(11): 1055-1070 (1993) |
| j4 | | Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, David Brown, Jarir K. Chaar, Ram Chillarege: A Case Study of Software Process Improvement During Development. IEEE Trans. Software Eng. 19(12): 1157-1170 (1993) |
| c10 | | Ram Chillarege: Top Five Challenges Facing the Practice of Fault Tolerance. Hardware and Software Architectures for Fault Tolerance 1993: 3-12 |
| c9 | | Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege: On the Evaluation of Software Inspections and Tests. ITC 1993: 180-189 |
| 1992 | ||
| j3 | | Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong: Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992) |
| c8 | | Lisa Spainhower, Jack Isenberg, Ram Chillarege, Joseph Berding: Design for Fault-Tolerance in System ES/9000 Model 900. FTCS 1992: 38-47 |
| c7 | | Mark Sullivan, Ram Chillarege: A Comparison of Software Defects in Database Management Systems and Operating Systems. FTCS 1992: 475-484 |
| 1991 | ||
| c6 | | Mark Sullivan, Ram Chillarege: Software Defects and their Impact on System Availability: A Study of Field Failures in Operating Systems. FTCS 1991: 2-9 |
| c5 |  | Ram Chillarege, Robert W. Horst, Daniel P. Siewiorek, Robert S. Swarz: Challenges in Designing Fault-Tolerant Systems. FTCS 1991: 114 |
| c4 | | Ram Chillarege, Wei-lun Kao, Richard G. Condit: Defect Type and Its Impact on the Growth Curve. ICSE 1991: 246-255 |
| 1989 | ||
| j2 | | Ram Chillarege, Ravishankar K. Iyer: An Experimental Study of Memory Fault Latency. IEEE Trans. Computers 38(6): 869-874 (1989) |
| c3 | | Ram Chillarege, Nicholas S. Bowen: Understanding large system failures-a fault injection experiment. FTCS 1989: 356-363 |
| c2 | | |
| 1987 | ||
| j1 | | Ram Chillarege, Ravishankar K. Iyer: Measurement-Based Analysis of Error Latency. IEEE Trans. Computers 36(5): 529-537 (1987) |
| 1985 | ||
| c1 | | Ram Chillarege, Ravishankar K. Iyer: The Effect of System Workload on Error Latency: An Experimental Study. SIGMETRICS 1985: 69-77 |
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